Electronics-Integrated Circuits and Devices(Date:2003/01/23)

Presentation
表紙

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[Date]2003/1/23
[Paper #]
目次

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[Date]2003/1/23
[Paper #]
Logic BIST Accelerator (LBA) : A Key Device for At-speed Testing of Large System-on-chips

Ichiro KOHNO,  Yoshio TAKAMINE,  

[Date]2003/1/23
[Paper #]
DFT Techniques for Wafer-Level At-Speed Testing of High-Speed SRAMs

K. Kushida,  O. Hirabayashi,  A. Suzuki,  T. Yabe,  A. Kawasumi,  Y. Takeyama,  A. Tohata,  N. Otsuka,  

[Date]2003/1/23
[Paper #]
Efficient and High Quality Test Using Deterministic Built-in Test

Kazumi HATAYAMA,  Michinobu NAKAO,  Yoshikazu KIYOSHIGE,  Koichiro NATSUME,  Yasuo SATO,  Takaharu NAGUMO,  

[Date]2003/1/23
[Paper #]
A new analytical technique with four nano-probes to inspect electrical characteristics of a device on actual circuits

Hiroshi YANAGITA,  Takayuki MIZUNO,  Fumiko YANO,  Kaoru UMEMURA,  Yasuhiro MITSUI,  

[Date]2003/1/23
[Paper #]
Bare Die Testing Technology to Realize Ultra High Density Three Dimensional LSI Stacking Module

Michinobu TANIOKA,  Yuji SHIRAI,  Kazumi KOJIMA,  Kenji TAKAHASHI,  

[Date]2003/1/23
[Paper #]
Development of Membrane Probe with Pyramidal Tips for LSI Testing

Susumu KASUKABE,  Terutaka MORI,  Takayoshi WATANABE,  Yasuhiro MOTOYAMA,  Yuji WADA,  

[Date]2003/1/23
[Paper #]
CD Measurement Technology using Electron Beam and Scope of Future Prospect

Tadashi Otaka,  

[Date]2003/1/23
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Inner Logic Detection Technique of LSI with Laser Probing pad

Masaru SANADA,  

[Date]2003/1/23
[Paper #]
Fault tracing of the SoC by utilizing successive circuit extraction from the layout : Fault tracing of the IP designed in a boundary scan manner

Katsuyoshi MIURA,  Koji NAKAMAE,  Hiromu FUJIOKA,  

[Date]2003/1/23
[Paper #]
Fault Isolation Techniques Using Pseudo Photo Emission Method and Scanning Spreading Resistance Microscopy on SRAM Macro-cells

Tatsuya ISHII,  Hironao IKEDA,  

[Date]2003/1/23
[Paper #]
High Sensitive Backside Emission Analysis for wafer

T. Yoshida,  A. Onoyama,  T. Koyama,  J. Komori,  Y. Mashiko,  

[Date]2003/1/23
[Paper #]
Investigation on the RF Frequency Error Removal System of OFDM Receiver by Array Antenna

Kazumi YAMAZAKI,  Yoshitomo KANEDA,  Takafumi MAEHARA,  Tomohisa WADA,  

[Date]2003/1/23
[Paper #]
Semiconductor device development using Data Mining

Hidetaka Tsuda,  Hidehiro Shirai,  Osamu Takagi,  

[Date]2003/1/23
[Paper #]
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[Date]2003/1/23
[Paper #]
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[Date]2003/1/23
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