Electronics-Integrated Circuits and Devices(Date:1993/12/16)

Presentation
表紙

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[Date]1993/12/16
[Paper #]
目次

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[Date]1993/12/16
[Paper #]
Approach of the reduction of VLSI testing cost

Atsushi Nigorikawa,  Eiki Matsuoka,  Seiichi Hannai,  Yasuhiro Nanba,  

[Date]1993/12/16
[Paper #]ICD93-147
Internal Diagnoses of Ultrahigh-Speed Integrated Circuits Using Electro-Optic Wafer Prober

Mitsuru Shinagawa,  Tadao Nagatsuma,  

[Date]1993/12/16
[Paper #]ICD93-148
Design for Testability of a 32bit Micro Controller

Toshinori Maeda,  Jiro Miyake,  Masahiko Ueda,  Akira Miyoshi,  Yoshito Nishimichi,  Tamotsu Nishiyama,  

[Date]1993/12/16
[Paper #]ICD93-149
A reduced scan shift method for sequential circuit testing

Yoshinobu Higami,  Seiji Kajihara,  Kozo Kinoshita,  

[Date]1993/12/16
[Paper #]ICD93-150
A Partial Scan Method Based on Reconvergences

Toshinobu Ono,  Rabindra K. Roy,  

[Date]1993/12/16
[Paper #]ICD93-151
Evaluation of Pad Strucures for Wire Bonding of Fine Pad Pitch

Kenji Toyosawa,  Kazuya Fujita,  Takamichi Maeda,  

[Date]1993/12/16
[Paper #]ICD93-152
The characterization of simultaneous switching noise by use of test device and electro-magnetic field simulation

Masayuki Miura,  Naohiko Hirano,  Yoichi Hiruta,  Toshio Sudo,  

[Date]1993/12/16
[Paper #]ICD93-153
[OTHERS]

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[Date]1993/12/16
[Paper #]