Electronics-Electronic Simulation Technology(Date:2017/05/19)

Presentation
Basic Theoretical Examination of Measurement Accuracy in the Use of Comparative Formulas with Multiple Reference Materials for Liquid Dielectric Measurement via the Open-ended Cut-off Circular Waveguide Reflection Method

Kouji Shibata(Hachinohe Inst. of Tech.),  Masaki Kobayashi(Hachinohe Inst. of Tech.),  

[Date]2017-05-19
[Paper #]EST2017-3
Acceleration using partially introduced double-precision arithmetic of IEEE 754-2008 quadruple-precision calculations for symmetric band eigenvalue problems

Masashi Eguchi(Chitose Inst. Sci. Tech.),  

[Date]2017-05-19
[Paper #]EST2017-5
Model Oder Reduction Preserving Passivity and Reciprocity of Electric Circuits

Yuichi Tanji(Kagawa Univ.),  

[Date]2017-05-19
[Paper #]EST2017-4
Analysis of High-frequency Signal Loss for Interconnecting Pads on the Si Substrate

Yoshito Kato(TCU),  Daichi Ichikawa(TCU),  Hao San(TCU),  Tsugumichi Shibata(TCU),  

[Date]2017-05-19
[Paper #]EST2017-1
Analysis of Electromagnetic Scattering by the Finite-Difference Complex Frequency Domain Method

Di Wu(Nihon Univ.),  Takashi Yamaguchi(TIRI),  Shinichiro Ohnuki(Nihon Univ.),  

[Date]2017-05-19
[Paper #]EST2017-2
Study on coupling structures for dielectric slot waveguides and hybrid plasmonic waveguides

Jiyao Yu(Tohoku Univ.),  Yasuo Ohtera(Tohoku Univ.),  Hirohito Yamada(Tohoku Univ.),  

[Date]2017-05-19
[Paper #]EST2017-7
Analysis of Butt Coupling of Optical Waveguides Using Propagation Operator Method Based on Finite Element Method

Keita Morimoto(Muroran Inst. Tech.),  Yasuhide Tsuji(Muroran Inst. Tech.),  

[Date]2017-05-19
[Paper #]EST2017-6