Electronics-Electromechanical Devices(Date:2017/02/17)

Presentation
Reliability of the Heavy-duty Reed Switches in Railway Application

Kenjiro Hamada(YCC),  Zhang Lin(YCC),  Kyoshi Matsuda(YCC),  Katsumi Yoshise(YCC),  

[Date]2017-02-17
[Paper #]R2016-66,EMD2016-93
The Investigation of Graphene Film as a New Electrical Contact Material

Kikuo Mori(YZK),  Hajime Takada(YZK),  Tetsuo Shimizu(AIST),  Sumiko Kawabata(AIST),  Miyuki Tanaka(AIST),  Toshitaka Kubo(AIST),  

[Date]2017-02-17
[Paper #]R2016-61,EMD2016-88
Properties of contact lubricant under high temperature and contact resistance

Terutaka Tamai(Elcontech),  Masahiro Yamakawa(TETRA),  

[Date]2017-02-17
[Paper #]R2016-60,EMD2016-87
Study on micro vibration sensing technique using Fabry-Perot interferometer with optical fibers

Kaoru Kuribayashi(CIT),  Ryo Nagase(CIT),  

[Date]2017-02-17
[Paper #]R2016-64,EMD2016-91
Effect of Hardness on Wear and Abrasion Resistance of Silver Plating on Copper Alloy

Shigeru Sawada(SEI),  Song-zhu Kure-chu(Iwate Uni.),  Rie Nakagawa(Iwate Uni.),  Toru Ogasawara(Iwate Uni.),  Hitoshi Yashiro(Iwate Uni.),  Yasushi Saitoh(AN-Tech),  

[Date]2017-02-17
[Paper #]R2016-63,EMD2016-90
Contorol of sliding wear for thin film sliding contacts.

Yuki Yamamoto(Omron),  Yoshihiro Umeuchi(Omron),  Makito Morii(OES),  

[Date]2017-02-17
[Paper #]R2016-62,EMD2016-89
DC300 V-150 A arcless current interruption by using arcless hybrid DC circuit breaker

Tatsuya Hayakawa(Titech),  Kyotaro Nakayama(Titech),  Shungo Zen(Titech),  Koichi Yasuoka(Titech),  

[Date]2017-02-17
[Paper #]R2016-69,EMD2016-96
Effect of various resin materials on arc duration under magnetic field

Daisuke Okazaki(OMRON),  Masayuki Noda(OMRON Relay and Device),  

[Date]2017-02-17
[Paper #]R2016-70,EMD2016-97
Study on the Relation between Filler of the Adhesive and Functions of Mechanical Devices

Osmau Ohtani(Omron Corp.),  Tomohiro Fukuhara(Omron Corp.),  

[Date]2017-02-17
[Paper #]R2016-68,EMD2016-95
Report on thermal simulation technique to analyze effect of contact bounce arc.

Kazua Murakami(Omron),  Takeshi Nishida(Omron),  Tetsuo Shinkai(OER),  

[Date]2017-02-17
[Paper #]R2016-71,EMD2016-98
A Study on Breakdown caused by Inorganic Phosphate and the Countermeasures

sadanori ito(itoken),  

[Date]2017-02-17
[Paper #]R2016-67,EMD2016-94
Fiber-optic measurement of sap consistency (5)

Masashi Iida(CIT),  Ryo Nagase(CIT),  

[Date]2017-02-17
[Paper #]R2016-65,EMD2016-92