Electronics-Electromechanical Devices(Date:2012/01/13)

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[Date]2012/1/13
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目次

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[Date]2012/1/13
[Paper #]
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism : Contact Resistance and its Model (20)

Shin-ichi WADA,  Keiji KOSHIDA,  Masahiro KAWANOBE,  Saindaa NOROVLING,  Naoki MASUDA,  Akira ISHIGURO,  Kunio YANAGI,  Hiroaki KUBOTA,  Koichiro SAWA,  

[Date]2012/1/13
[Paper #]EMD2011-112
Relationship between moving range of break arcs and radius of curvature of electrical contacts in a DC48V circuit

Toru SUGIURA,  Junya SEKIKAWA,  Takayoshi KUBONO,  

[Date]2012/1/13
[Paper #]EMD2011-113
Dependences of Surface Condition and Contact Resistance Eroded by Break Arcs on Contact Opening Speed

Katsuyoshi MIYAJI,  Junya SEKIKAWA,  Takayoshi KUBONO,  

[Date]2012/1/13
[Paper #]EMD2011-114
Non-Contact PIM Characteristics Evaluation of Printed Circuit Board using the standing wave coaxial tube method

Keita HOSHINO,  Daijiro ISHIBASHI,  Kensuke SAITO,  Nobuhiro KUGA,  

[Date]2012/1/13
[Paper #]EMD2011-115
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[Date]2012/1/13
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[Date]2012/1/13
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