Electronics-Electromechanical Devices(Date:2010/02/12)

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[Date]2010/2/12
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目次

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[Date]2010/2/12
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Note

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[Date]2010/2/12
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Degradation phenomenon of electrical contacts by hammering oscillating mechanism : modeling of the oscillating mechanism (7)

Shin-ichi WADA,  Keiji KOSHIDA,  Taketo SONODA,  Saindaa NOROVLIN,  Mitsuo KIKUCHI,  Hiroaki KUBOTA,  Koichiro SAWA,  

[Date]2010/2/12
[Paper #]R2009-50,EMD2009-117
A Study on Improvement for Seal property of Electromechanical Devices : The behavior of One-Part Epoxy Resin in a narrow gap

Osamu Ohtani,  Seiji Nakajima,  Tomohiro Fukuhara,  

[Date]2010/2/12
[Paper #]R2009-51,EMD2009-118
An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts (III)

Makoto HASEGAWA,  Yoshiyuki KOHNO,  

[Date]2010/2/12
[Paper #]R2009-52,EMD2009-119
Optical Beam Profiler using Perturbation Interruption Method

Seiichi ONODA,  Keiichi INOUE,  Koji AITA,  Masayuki NAKANO,  

[Date]2010/2/12
[Paper #]R2009-53,EMD2009-120
Accuracy Improvement of BOF/DWPR Temperature Sensing Using a Reference BOF

Yasutoshi KOMATSU,  Ryuji NAGAI,  Keiichi INOUE,  Seiichi ONODA,  

[Date]2010/2/12
[Paper #]R2009-54,EMD2009-121
Cut Set Analysis of Fault Tree with Priority AND Gates

Taijirou YONEDA,  Tetsushi YUGE,  Nobuyuki TAMURA,  Shigeru YANAGI,  

[Date]2010/2/12
[Paper #]R2009-55,EMD2009-122
Observation of wear status of tin plating for automotive connector at initial stage of sliding

Shigeru SAWADA,  Terutaka TAMAI,  Yasuhiro HATTORI,  Kazuo IIDA,  

[Date]2010/2/12
[Paper #]R2009-56,EMD2009-123
Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance

Yuya Nabeta,  Shigeru Sawada,  Yasushi Saitoh,  Atsushi Shimizu,  Yasuhiro Hattori,  Terutaka Tamai,  

[Date]2010/2/12
[Paper #]R2009-57,EMD2009-124
A Study on growth of hair silver

Sadanori ITO,  Takafumi SASAKI,  Hiroki YAMAGUCHI,  

[Date]2010/2/12
[Paper #]R2009-58,EMD2009-125
Measurement of Electrical Property of Sn Oxide Layer Using Liquid Metal

Tomoki YONEKAWA,  Yasushi SAITOH,  Kazuo IIDA,  Shigeru SAWADA,  Yasuhiro HATTORI,  

[Date]2010/2/12
[Paper #]R2009-59,EMD2009-126
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