Electronics-Electromechanical Devices(Date:2009/02/13)

Presentation
表紙

,  

[Date]2009/2/13
[Paper #]
目次

,  

[Date]2009/2/13
[Paper #]
Contact resistance analysis of electric contact with tin or silver plated layer

Shigeru SAWADA,  Kaori SHIMIZU,  Yasuhiro HATTORI,  Terutaka TAMAI,  

[Date]2009/2/13
[Paper #]R2008-44,EMD2008-120
Growth Law of the Oxide Film Formed on the Tin Plated Contact Surface and Its Contact Resistance Characteristic

Yuuya Nabeta,  Yasushi Saitoh,  Sigeru Sawada,  Yasuhiro Hattori,  Terutaka Tamai,  

[Date]2009/2/13
[Paper #]R2008-45,EMD2008-121
Influence of Aging on Contact Resistance Characteristics of Tin Plated Contacts

Yuichi TOMINAGA,  Takuya YAMANAKA,  Yasushi SAITOH,  Terutaka TAMAI,  Kazuo IIDA,  Yasuhiro HATTORI,  

[Date]2009/2/13
[Paper #]R2008-46,EMD2008-122
Influence of Fretting Corrosion on Lifetime of Tin Plated Connectors

Daiji ITO,  Hirosaka IKEDA,  Yasushi SAITOH,  Terutaka TAMAI,  Kazuo IIDA,  Tetsuya ITO,  Yasuhiro HATTORI,  

[Date]2009/2/13
[Paper #]R2008-47,EMD2008-123
Microscopy Study of Fretting Corrosion of the Tin Plated Contacts

Tetsuya Ito,  Shigeru Sawada,  Yoshiyuki Nomura,  Yasuhiro Hattori,  Yasushi Saitoh,  Terutaka Tamai,  Kazuo Iida,  

[Date]2009/2/13
[Paper #]R2008-48,EMD2008-124
An experimental study on evaluation system for contact surfaces with an optical-cross method

Makoto KASHIWAKURA,  Shunsuke KUDO,  Asuka SUDO,  Makoto HASEGAWA,  

[Date]2009/2/13
[Paper #]R2008-49,EMD2008-125
Degradation phenomenon of electrical contacts by hammering oscillating mechanism : for Contact Resistance (IV)

Shin-ichi WADA,  Taketo SONODA,  Keiji KOSHIDA,  Mitsuo KIKUCHI,  Hiroaki KUBOTA,  Koichiro SAWA,  

[Date]2009/2/13
[Paper #]R2008-50,EMD2008-126
Pull strength analysis of Pb free solder at a connected point

Taku HASHIGUCHI,  Yuta NASUKAWA,  Kazunori HIRAOKA,  

[Date]2009/2/13
[Paper #]R2008-51,EMD2008-127
Evaluation of electric contact trouble caused by silicone : Evaluation test with new environmental examination device

Makito Morii,  Hiroyuki Moriwaki,  Hideki Tanaka,  Yoshitaka Ueki,  Kenji Suzuki,  Kimio Yoshizumi,  Masanobu Nishikawa,  

[Date]2009/2/13
[Paper #]R2008-52,EMD2008-128
Dependency of Occurrence of Contact Failure due to Silicone Contamination on Electrical Load Conditions

Terutaka Tamai,  

[Date]2009/2/13
[Paper #]R2008-53,EMD2008-129
An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts

Makoto HASEGAWA,  Takuma MATSUTO,  Yoshiyuki KOHNO,  Hiroshi ANDO,  

[Date]2009/2/13
[Paper #]R2008-54,EMD2008-130
Effect of Inorganic Phosphate in Resin on EMC

Sadanori ITO,  

[Date]2009/2/13
[Paper #]R2008-55,EMD2008-131
Avoidance for lightning damages on the stray metal portion of the broadcasting system

Kazuaki WAKAI,  Yuji SAWAGURI,  

[Date]2009/2/13
[Paper #]R2008-56,EMD2008-132
Reliability test results for SC and MU connectors installed on outside plant

Yoshiteru ABE,  Shuichi YANAGI,  Shuichirou ASAKAWA,  Ryo NAGASE,  

[Date]2009/2/13
[Paper #]R2008-57,EMD2008-133
複写される方へ

,  

[Date]2009/2/13
[Paper #]
Notice for photocopying

,  

[Date]2009/2/13
[Paper #]
奥付

,  

[Date]2009/2/13
[Paper #]