Electronics-Electromechanical Devices(Date:2008/05/09)

Presentation
表紙

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[Date]2008/5/9
[Paper #]
目次

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[Date]2008/5/9
[Paper #]
Degradation phenomenon of electrical contacts by 3-D oscillating : Basal characteristics of 3-D oscillating mechanism

Shin-ichi WADA,  Hiroshi AMAO,  Keiji KOSHIDA,  Taketo SONODA,  Hiroto MINEGISHI,  Mitsuo KIKUCHI,  Hiroaki KUBOTA,  Koichiro SAWA,  

[Date]2008/5/9
[Paper #]EMD2008-5
Spectrum measurement of contacts metal and gas molecular spectra in Break Arc : Spectrum intensity of silver and silver alloy contact

Kiyoshi YOSHIDA,  Tatsuya KUROSAKA,  

[Date]2008/5/9
[Paper #]EMD2008-6
Observations of Step-like Contact Voltage Variations in Pd

Shunsuke SASAKI,  Hiroyuki ISHIDA,  Shosuke SUZUKI,  Masanari TANIGUCHI,  Tasuku TAKAGI,  

[Date]2008/5/9
[Paper #]EMD2008-7
A trial on assembling a height measurement system utilizing a confocal optical system

Makoto HASEGAWA,  

[Date]2008/5/9
[Paper #]EMD2008-8
Linearity of resistors : Measurement of electrical distortion caused by resistors

Isao Minowa,  Yuji Ide,  Shunsuke Kaneko,  

[Date]2008/5/9
[Paper #]EMD2008-9
Standardization of optical circuit boards for IEC TC86 JWG9

Junya KOBAYASHI,  Ryo NAGASE,  

[Date]2008/5/9
[Paper #]EMD2008-10
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[Date]2008/5/9
[Paper #]
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[Date]2008/5/9
[Paper #]
奥付

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[Date]2008/5/9
[Paper #]