Electronics-Electromechanical Devices(Date:2008/04/11)

Presentation
表紙

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[Date]2008/4/11
[Paper #]
目次

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[Date]2008/4/11
[Paper #]
Degradation phenomenon of electrical contacts by hammering oscillating mechanism : modeling of the oscillating mechanism

Shin-ichi WADA,  / /,  Hiroshi AMAO,  Taketo SONODA,  Yasuo TAKAHASHI,  Mitsuo KIKUCHI,  Hiroaki KUBOTA,  Koichiro SAWA,  

[Date]2008/4/11
[Paper #]EMD2008-1
Singularity of Contact Resistance Characteristics for Tin Contacts

Terutaka Tamai,  Katsunori Hotta,  Yasushi Saitoh,  Yasuhiro Hattori,  

[Date]2008/4/11
[Paper #]EMD2008-2
Electrodeposition of Organic Dielectric Film on MEMS Devices for Improvement of Reliability

Tomomi SAKATA,  Kei KUWABARA,  Norio SATO,  Toshishige SHIMAMURA,  Hiromu ISHII,  Kazuhisa KUDOU,  Katsuyuki MACHIDA,  

[Date]2008/4/11
[Paper #]EMD2008-3
A study on contact spots of the relays used for earthquake disasters by Surface Potential Microscopy

Yoshitada WATANABE,  Yuichi HIRAKAWA,  

[Date]2008/4/11
[Paper #]EMD2008-4
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[Date]2008/4/11
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[Date]2008/4/11
[Paper #]
奥付

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[Date]2008/4/11
[Paper #]