Electronics-Electromechanical Devices(Date:2008/02/08)

Presentation
表紙

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[Date]2008/2/8
[Paper #]
目次

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[Date]2008/2/8
[Paper #]
Development of Simple ESD Checker and it's Application : Detection of ESD destroy phenomenon

Norio YAMASAKI,  Masaru SANADA,  

[Date]2008/2/8
[Paper #]R2007-59,EMD2007-114
Reliability design and applications for the Non power supply type optical transmission unit

Yoshikazu TOBA,  Kazuaki WAKAI,  

[Date]2008/2/8
[Paper #]R2007-60,EMD2007-115
Decomposition processes of silicone and electrical contact failure : Influence of silicone contamination on contact devices

Terutaka Tamai,  Yasuhiro Hattori,  Hirosaka Ikeda,  

[Date]2008/2/8
[Paper #]R2007-61,EMD2007-116
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism : 3-D oscillating mechanism for trial

Shin-ichi WADA,  Hiroshi AMAO,  Hiroto MINEGISGI,  Keiji KOSHIDA,  Taketo SONODA,  Mitsuo KIKUCHI,  Hiroaki KUBOTA,  Koichiro SAWA,  

[Date]2008/2/8
[Paper #]R2007-62,EMD2007-117
Contact Resistance Characteristics of Tin Plated Contacts with Switching Operation and Surface Observation

Shinya NAKAMURA,  Yuji YAMASHITA,  Yasushi SAITOH,  Terutaka TAMAI,  Kazuo IIDA,  Yasuhiro HATTORI,  

[Date]2008/2/8
[Paper #]R2007-63,EMD2007-118
Study of Behavior of Contact Resistance of Fretting Corrosion

Naoyuki SATO,  Yasushi SAITOH,  Terutaka TAMAI,  Kazuo IIDA,  Tetsuya ITO,  Yasuhiro HATTORI,  

[Date]2008/2/8
[Paper #]R2007-64,EMD2007-119
Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector

Yasutoshi KOMATSU,  Keiichi INOUEO,  Seiichi ONODA,  Nobuo TSUKAMOTO,  

[Date]2008/2/8
[Paper #]R2007-65,EMD2007-120
The investigation of the material for hermetic sealing : About gas permeation of materials

Tetsuo HAYASE,  Ichizo SAKAMOTO,  

[Date]2008/2/8
[Paper #]R2007-66,EMD2007-121
Reliability of Optical Connector Assembled with Instant Adhesive

Shuichi Yanagi,  Shinsuke Matsui,  Shigeru Hosono,  Ryo Nagase,  

[Date]2008/2/8
[Paper #]R2007-67,EMD2007-122
Holography and Its Application to Reliability Evaluation of the Electromechnical Devices

Masanari TANIGUCHI,  

[Date]2008/2/8
[Paper #]R2007-68,EMD2007-123
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[Date]2008/2/8
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[Date]2008/2/8
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[Date]2008/2/8
[Paper #]