Electronics-Electromechanical Devices(Date:2003/11/14)

Presentation
表紙

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[Date]2003/11/14
[Paper #]
目次

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[Date]2003/11/14
[Paper #]
Investigation of Arcing Damage on a Connector During Hot Unplugging in new 42V Automotive Power net (Session 4 : Arc discharges and related phenomena)

J. Razafiarivelo,  Y. Kuwada,  L. Morin,  Jemaa N. Ben,  A. El Manfalouti,  

[Date]2003/11/14
[Paper #]EMD2003-75
Relationship between transition boundary to gaseous phase and spectrum intensity in Ag break arc (Session 4 : Arc discharges and related phenomena)

Kiyoshi YOSHIDA,  Atsuo TAKAHASHI,  

[Date]2003/11/14
[Paper #]EMD2003-76
Arc extinction and reignition at a fixed short gap (Session 4 : Arc discharges and related phenomena)

Keiichi Suhara,  

[Date]2003/11/14
[Paper #]EMD2003-77
Temperature Measurements and Behavior Observations of Breaking Arc between Copper Contacts (Session 4 : Arc discharges and related phenomena)

Tetsuya KITAJIMA,  Junya SEKIKAWA,  Takayoshi KUBONO,  Mitsuru TAKEUCHI,  

[Date]2003/11/14
[Paper #]EMD2003-78
Research on Calculation of Cathode Root Properties in Carbon Vacuum Arc (Session 4 : Arc discharges and related phenomena)

Daisuke Sakai,  Yoshiharu Saito,  Junya Sekikawa,  Takayoshi Kubono,  

[Date]2003/11/14
[Paper #]EMD2003-79
Observation of Breaking Arcs of Ag or Cu Electrical Contact Pairs with a High-speed Camera (Session 4 : Arc discharges and related phenomena)

Junya SEKIKAWA,  Takayoshi KUBONO,  

[Date]2003/11/14
[Paper #]EMD2003-80
[Invited Paper] Numerical Analysis and Experimental Investigation of Dynamic Behavior of AC Contactors Concerning with the Bounce of Contacts (Session 5 : Switching devices)

Degui Chen,  Xingwen Li,  Zhipeng Li,  Weixiong Tong,  

[Date]2003/11/14
[Paper #]EMD2003-81
Relay contact of multi-electrodes with timely controlled operation (Session 5 : Switching devices)

Yu YONEZAWA,  Noboru WAKATSUKI,  

[Date]2003/11/14
[Paper #]EMD2003-82
Study on the Safety Evaluation Method of the Power Reed Switch : Estimation on the Occurrence Probability of Failure to Danger based on Field Data (Session 5 : Switching devices)

Kenjiro HAMADA,  Yoichi WAKABAYASHI,  Shigeo UMEZAKI,  Shigenobu KOBAYASHI,  

[Date]2003/11/14
[Paper #]EMD2003-83
[Invited paper] Computer and Lab Simulation of Particulate Effect on Electric Contact Reliability (Session 6 : Contact Phenomena (2))

Liang-Jun Xu,  Xue-Yan Lin,  

[Date]2003/11/14
[Paper #]EMD2003-84
Testing Method Study of Contact Resistance Behavior on Contaminated Contact Area (Session 6 : Contact Phenomena (2))

Cui-Feng Feng,  

[Date]2003/11/14
[Paper #]EMD2003-85
Contact Behaviors of New Material for Micro Relays (Session 6 : Contact Phenomena (2))

Terutaka Tamai,  

[Date]2003/11/14
[Paper #]EMD2003-86
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[Date]2003/11/14
[Paper #]
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[Date]2003/11/14
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