Electronics-Electromechanical Devices(Date:2000/12/08)

Presentation
表紙

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[Date]2000/12/8
[Paper #]
目次

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[Date]2000/12/8
[Paper #]
The shield structure and the EMI characteristic in subrack for Metric Equipment Practice

Ryuzo Yokoyama,  Shoji Matsumoto,  Masao Sasajima,  Fumiyasu Kaneyama,  Yuhiko Fujiwara,  

[Date]2000/12/8
[Paper #]EMD2000-73
Study for Shielding effectiveness of Sub-rack for Telecommunication equipment

Itaru Matsuda,  

[Date]2000/12/8
[Paper #]EMD2000-74
Materials of wiring boards for high-speed performance and recent trends in developemt

Shigeo Sase,  

[Date]2000/12/8
[Paper #]EMD2000-75
Development of High Density Build-up Substrate by Via Filling

Takashi Nakamura,  Tetsuro Hamada,  Toshikazu Okubo,  Toshiaki Ishii,  

[Date]2000/12/8
[Paper #]EMD2000-76
A study on shock hardness for contacts

S. Watanabe,  K. Takahashi,  H. Kamijima,  K. Ohnishi,  

[Date]2000/12/8
[Paper #]EMD2000-77
The study of High speed connector design.

Mamoru Nagase,  Akihiro Yodogawa,  Eddie Azuma,  

[Date]2000/12/8
[Paper #]EMD2000-78
Arcing and its subsequent degradations on the contact material of automotive power relays and switches : material transfer

L. Morin,  N.Ben Jemaa,  H. Sone,  D. Jeannot,  

[Date]2000/12/8
[Paper #]EMD2000-79
An Effect of Ambient Gas on the Contact Voltage Drop

Takahiro UENO,  Koichiro SAWA,  

[Date]2000/12/8
[Paper #]EMD2000-80
An Experiment on Operating Characteristics of Ag, Pd and Cu Contacts in Nitrogen Atmosphere

Jiro MAKIMOTO,  Makoto HASEGAWA,  Koichiro SAWA,  

[Date]2000/12/8
[Paper #]EMD2000-81
Observation of the Contact Damage of AgCd and AgSn Compounds by Breaking Arc at Small Operation Numbers

Hiroshi INOUE,  Yuki TAKAHASHI,  Gaku YAMAMOTO,  

[Date]2000/12/8
[Paper #]EMD2000-82
[OTHERS]

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[Date]2000/12/8
[Paper #]