Electronics-Electromechanical Devices(Date:1998/05/15)

Presentation
表紙

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[Date]1998/5/15
[Paper #]
目次

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[Date]1998/5/15
[Paper #]
Measurements of Temperature of Breaking Arc between Copper Contacts in a DC50V-10A circuit.

Takayoshi Kubono,  Takayoshi Suzuki,  

[Date]1998/5/15
[Paper #]
A study of Numerical Evaluation for the Erosion of Electrical Contacts Mounted on Relays.

Takayoshi KUBONO,  Shinnichi TOKUNAGA,  

[Date]1998/5/15
[Paper #]
Increase in Contact Resistance of Hard Gold Plating During Thermal Aging Due to the Oxide Film Formation. : Nickel-hardened gold(NiHG) electroplate & Cobalt-hardened gold(CoHG) electroplate

Hisao KUMAKURA,  Makotoo SEKIGUCHI,  

[Date]1998/5/15
[Paper #]
Development of Polyimide Optical Waveguides

Mitsuo Ukechi,  Takuya Miyashita,  Ryoji Kaku,  

[Date]1998/5/15
[Paper #]
On the Plasma-Catalytic Reactor of Fan Type

Kagehiro ITOYAMA,  Takeshi YANOBE,  Yuji HAYASHI,  Hiroshige MATSUMOTO,  

[Date]1998/5/15
[Paper #]
[OTHERS]

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[Date]1998/5/15
[Paper #]