Electronics-Electron Devices(Date:2004/11/05)

Presentation
表紙

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[Date]2004/11/5
[Paper #]
目次

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[Date]2004/11/5
[Paper #]
Probabilistic safety assessment and management of control laws

Koichi SUYAMA,  

[Date]2004/11/5
[Paper #]R2004-40,ED2004-153
Blocking Capability of SOI-LIGBTs Imposed thermal and Electrical Stress

Hitoshi Sumida,  

[Date]2004/11/5
[Paper #]R2004-41,ED2004-154
Reliability Evaluation of Au Interconnect with Electromigration

Naoyuki Miyashita,  Norikazu Iwagami,  Syunji Gomi,  Yukihiko Furukawa,  Junji Saito,  

[Date]2004/11/5
[Paper #]R2004-42,ED2004-155
Control of metal-semiconductor and insulator-semiconductor interfaces in nitride electron devices

Tamotsu Hashizume,  Junji Kotani,  Hideki Hasegawa,  

[Date]2004/11/5
[Paper #]R2004-43,ED2004-156
Surface passivation for AlGaN/GaN HEMT by Cat-CVD SiN films

Masahiro TOTSUKA,  Tomoki OKU,  Shinichi MIYAKUNI,  Toshihiko SHIGA,  Tetsuo KUNII,  Yoshitaka KAMO,  Hirofumi NAKANO,  

[Date]2004/11/5
[Paper #]R2004-44,ED2004-157
The Mechanism of Plasma-induced Fluorine damage and The Recovery Using X-ray Irradiation

Takeshi KIKAWA,  Takafumi TANIGUCHI,  Hiroyuki UCHIYAMA,  

[Date]2004/11/5
[Paper #]R2004-45,ED2004-158
Reliability of 0.18 μm gate GaAs-MESFETs fabricated by i-line lithography process

Yasuhiro TOSAKA,  Masataka WATANABE,  Daiji FUKUSHI,  Hiroshi YANO,  Shigeru NAKAJIMA,  

[Date]2004/11/5
[Paper #]R2004-46,ED2004-159
Improvement in Reliability of InP-Based HEMTs by Suppressing Impact Ionization

Naoki HARA,  Naoya OKAMOTO,  Kenji IMANISHI,  Tsuyoshi TAKAHASHI,  Kozo MAKIYAMA,  

[Date]2004/11/5
[Paper #]R2004-47,ED2004-160
Relation between degradation properties of InP HBTs and their 40Gb/s digital ICs

Yoshino K. FUKAI,  Kenji KURISHIMA,  Minoru IDA,  Shoji YAMAHATA,  Takatomo ENOKI,  

[Date]2004/11/5
[Paper #]R2004-48,ED2004-161
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[Date]2004/11/5
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[Date]2004/11/5
[Paper #]