IEICE Technical Committee

Electronics-Electron Devices(Date:2003/06/23)

Presentation

[Date]2003/6/23
[Paper #]

[Invited] Front-End Process Technology for Sub-50nm CMOS and Beyond (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Yoshitaka TSUNASHIMA,

[Date]2003/6/23
[Paper #]ED2003-63,SDM2003-74

Junction Leakage Characteristics of Shallow Trench Isolation (STI) with Nitrogen Pile-Up Sidewall Oxide(AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Myeong Won Lee, In Man Kang, Byung Yong Choi, Dong-Soo Woo, Woo Young Choi, Jong Duk Lee, Byung-Gook Park,

[Date]2003/6/23
[Paper #]ED2003-64,SDM2003-75

Shallow Junction formed by UV Pulsed Laser Annealing for Si Micro-Electronics (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Takashi NOGUCHI,

[Date]2003/6/23
[Paper #]ED2003-65,SDM2003-76

Fabrication of low loss transmission line with Surface micromachining technology (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Han-Shin Lee, Dong-Hoon Shin, Soon-Koo Kim, Hyun-Chang Park, Jin-Koo Rhee,

[Date]2003/6/23
[Paper #]ED2003-66,SDM2003-77

Structural Analyses of Cu[111] Layer on Nb[110] Barrier Formed on SiO_2 (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Md. MANIRUZZAMAN, Mayumi B. Takeyama, Yuichiro HAYASAKA, Eiji AOYAGI, Tetu OHSUNA, Atsushi NOYA,

[Date]2003/6/23
[Paper #]ED2003-67,SDM2003-78

[Invited] High Performance Poly-silicon TFT by Excimer Laser Annealing (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Min Koo Han,

[Date]2003/6/23
[Paper #]ED2003-68,SDM2003-79

Effects of Self-Aligned Field Induced Drain with Double Spacer on the Characteristics of Pol-Si TFT (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Jeong-Ah Ahn, Ohyun Kim,

[Date]2003/6/23
[Paper #]ED2003-69,SDM2003-80

Properties of LiNbO_3 thin films fabricated by CSD (Chemical Solution Decomposition) method (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Yong-Seong Kim, Soon-Won Jung, Sang-Hyun Jeong, Yong-Il In, Kwang-Ho Kim, Kwangsoo No,

[Date]2003/6/23
[Paper #]ED2003-70,SDM2003-81

Local characterization of electronic transport in microcrystalline germanium thin films by atomic force microscopy using a conducting probe (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

K. Makihara, Y. Okamoto, H. Nakagawa, M. Ikeda, H. Murakami, S. Miyazaki,

[Date]2003/6/23
[Paper #]ED2003-71,SDM2003-82

[Invited] Double-Gate MOSFETs for Nano CMOS Technology : Body-tied Double-Gate MOSFETs (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Jong-Ho Lee, Tai-su Park, Euijoon Yoon,

[Date]2003/6/23
[Paper #]ED2003-72,SDM2003-83

[Invited] Potential of SOI Devices in Sub-100-nm Technology Era : Challenging Studies (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Yasuhisa Omura,

[Date]2003/6/23
[Paper #]ED2003-73,SDM2003-84

Reverse-Order Source/Drain with Double Offset Spacer (RODOS) for Sub-50nm Low-Power and High-Speed MOSFET Design (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Woo Young Choi, Byung Yong Choi, Dong-Soo Woo, Jong Duk Lee, Byung-Gook Park,

[Date]2003/6/23
[Paper #]ED2003-74,SDM2003-85

High-Voltage MOS Devices with High Energy Implanted Buried Layer : Low-Voltage CMOS Process Comparable High-Voltage MOS Devices (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Pyong-Su Kwag, Chul-Ju Ko, Oh-Kyong Kwon,

[Date]2003/6/23
[Paper #]ED2003-75,SDM2003-86

Design of an IC-Card Interface Chipset with 3.3V/5V DC-DC Converter (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Won-Seok Oh, Seung-Eun Lee, Kyoung-Youn Cho, Jeong-Wook Seo, Sung-Chul Lee,

[Date]2003/6/23
[Paper #]ED2003-76,SDM2003-87

[Invited] Ultra-High-Speed InP-Based HEMTs with Sub-50-nm Gate : Impact of Side-Gate-Recess and Parasitic Resistance on High-Speed Performance (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Keisuke SHINOHARA, Yoshimi YAMASHITA, Akira ENDOH, Issei WATANABE, Kohki HIKOSAKA, Takashi MIMURA, Satoshi HIYAMIZU, Toshiaki MATSUI,

[Date]2003/6/23
[Paper #]ED2003-77,SDM2003-88

Optimization Study on the Epitaxial Structures of Over-100-GHz Metamorphic : HEMTs for the Millimeter-wave Applications (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Myung-Sik Son, Mi-Ra Kim, Bok-Hyoung Lee, Jin-Koo Rhee,

[Date]2003/6/23
[Paper #]ED2003-78,SDM2003-89

Optical Characteristics of InP/InGaAs HBTs (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Jae-Hong Park, Kang-Dae Kim, Yong-Kyu Kim, Moon-Tae Jung, Sung-Bum Hwang, Chung-Kun Song,

[Date]2003/6/23
[Paper #]ED2003-79,SDM2003-90

Bias acceleration of drain resistance increase in InP-based HEMTs and lifetime enhancement by low-bias design of ICs (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))

Yoshino K. Fukai, Suehiro Sugitani, Takatomo Enoki, Hiroto Kitabayashi, Koichi Murata, Takashi Makimura, Yasuro Yamane, Masahiro Yamaguchi,

[Date]2003/6/23
[Paper #]ED2003-80,SDM2003-91