Electronics-Electron Devices(Date:1997/07/15)

Presentation
表紙

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[Date]1997/7/15
[Paper #]
目次

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[Date]1997/7/15
[Paper #]
A TEM/AEM Study of Nano-Structures in Semiconductor Devices

Yuji Otsuka,  kenji Kawano,  Tomohiko Yamamoto,  Yoshiharu Tanii,  Seiichirou Horii,  Yukio Murata,  

[Date]1997/7/15
[Paper #]ED97-75
Atomic-scale imaging of compound semiconductors with a noncontact atomic force microscope

Seizo Morita,  Yasuhiro Sugawara,  Takayuki Uchihashi,  Hitoshi Ueyama,  Takahiro Tsukamoto,  

[Date]1997/7/15
[Paper #]ED97-76
Kelvin probe force microscopy for characterization of semiconductor devices and process

Masafumi Tanimoto,  

[Date]1997/7/15
[Paper #]ED97-77
Ballistic Electron Emission Microscopy Studies of Inhomogeneity in Au/CaF_2/n- Si(111) Interfaces

Touru SUMIYA,  Tadao MIURA,  Shun-ichiro Tanaka,  

[Date]1997/7/15
[Paper #]ED97-78
Nanofabrication of n-GaAs by Electrochemical STM

T. Okumura,  C. Kaneshiro,  

[Date]1997/7/15
[Paper #]ED97-79
Wafer-scale Nano-fabrication using Single-Ion-Implantation and Electrochemical Process

Ken-ichi Hara,  Iwao Ohdomari,  

[Date]1997/7/15
[Paper #]ED97-80
FABRICATION OF MINIATURE TUNNEL JUNCTION BY ELELCTRON-BEAM-INDUCED METAL DEPOSITION

Masanori KOMURO,  Hiroshi HIROSHIMA,  

[Date]1997/7/15
[Paper #]ED97-81
Self-Organized Tetrahedral-Shaped Recess InGaAs Stacked Quantum Dots

Y. Awano,  Y. Sakuma,  Y. Sugiyama,  M. Shima,  T. Struts,  C. Wirner,  N. Yokoyama,  

[Date]1997/7/15
[Paper #]ED97-82
[OTHERS]

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[Date]1997/7/15
[Paper #]