Electronics-Electron Devices(Date:1995/04/21)

Presentation
表紙

,  

[Date]1995/4/21
[Paper #]
目次

,  

[Date]1995/4/21
[Paper #]
Investigation of Porous Silicon Electroluminescence during Anodic Oxidation and its micro-structure analysis

Tadashi Sakai,  Taketoshi Suzuki,  Li Zhang,  

[Date]1995/4/21
[Paper #]
LED Fabrication and Investigation by Impurity Doping into Porous Si

L. Zhang,  T. Sakai,  T. Suzuki,  

[Date]1995/4/21
[Paper #]
Valence Band Alignment at Ultra-Thin SiO_2/Si(111) Interfaces as Determined by High-Resolution X-Ray Photoelectron Spectroscopy

Josep L. Alay,  Masatoshi Fukuda,  Claes Bjorkman,  Kazuyuki Nakagawa,  Shin Yokoyama,  Masataka Hirose,  

[Date]1995/4/21
[Paper #]
Interfacial reactions in the Zr-Si system observed by in-situ TEM

Hiroyuki Tanaka,  Masao Okihara,  Norio Hirashita,  Toyohiko J. Konno,  Robert Sinclair,  

[Date]1995/4/21
[Paper #]
The Effect on the Tunnel Oxide Characteristics of Insulator Films on the Gate Electrode

M. Ushiyama,  H. Miura,  H. Yashima,  T. Adachi,  T. Nishimoto,  K. Komori,  M. Katoh,  H. Kume,  Y. Ohji,  

[Date]1995/4/21
[Paper #]
Valence-band discontinuity at InAs nanocrystal/Se-terminated GaAs hetero-interface

Yoshio Watanabe,  Fumihiko Maeda,  Takanori Kiyokura,  Masaharu Oshima,  

[Date]1995/4/21
[Paper #]
AFM observation of heterointerface of OMVPE grown GaInAs/InP resonant tunneling diodes

Michihiko Suhara,  Cyuma Nagao,  Daisuke Sonoda,  Yasuyuki Miyamoto,  Kazuhito Furuya,  

[Date]1995/4/21
[Paper #]
Interface flatness and abruptness control using MOVPE and their effects on optical and electrical characteristics

Masanori Shinohara,  Haruki Yokoyama,  Naohisa Inoue,  

[Date]1995/4/21
[Paper #]
Nano-pattern transfer using an image reversal process with ECR plasma oxidation and its application to fabrication of Si quantum wire

Kenji Kurihara,  Kazumi Iwadate,  Hideo Namatsu,  Masao Nagase,  Kastumi Murase,  

[Date]1995/4/21
[Paper #]
Silicon based single electron tunneling transistor operated at 4.2K

A. Ohata,  H. Niiyama,  T. Shibata,  K. Nakajima,  A. Toriumi,  

[Date]1995/4/21
[Paper #]
Single-electron memory effect of satellite Si islands in a Si-SET

A. Fujiwara,  Y. Takahashi,  K. Murase,  M. Tabe,  

[Date]1995/4/21
[Paper #]
Conductance Oscillations in a Split-Gate MOSFET Fabricated on an SOI Substrate

Hiroki Ishikuro,  Toshiro Hiramoto,  Hiroyuki Fujita,  Toshiaki Ikoma,  

[Date]1995/4/21
[Paper #]
SINGLE ELECTRON TRAPS IN A ONE DIMENSIONAL TRAPS

T. Sakamoto,  Y. Nakamura,  S.W. Hwang,  K. Nakamura,  

[Date]1995/4/21
[Paper #]
[OTHERS]

,  

[Date]1995/4/21
[Paper #]