Electronics-Component Parts and Materials(Date:2000/08/17)

Presentation
表紙

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[Date]2000/8/17
[Paper #]
目次

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[Date]2000/8/17
[Paper #]
CPM2000-70 Application of Al-Mo thin alloy films as a passivation layer on Cu

Mayumi B. TAKEYAMA,  Atsushi NOYA,  

[Date]2000/8/17
[Paper #]CPM2000-70
CPM2000-71 Suppression Effect of the Capacitance Reduction of Thin Film Capacitor by Substituting Ta Nitride with Ta-Al Compound

A. Tanabe,  M. Yamane,  K Sasaki,  Y. Abe,  

[Date]2000/8/17
[Paper #]CPM2000-71
CPM2000-72 Formation Process of WOx Thin Films and Their Electrical and Optical Properties

A. Yamamoto,  E. Washizu,  Y. Abe,  M. Kawamura,  K. Sasaki,  

[Date]2000/8/17
[Paper #]CPM2000-72
CPM2000-73 Pt-WO_3 Gate MOSFET Sensor For CO Gas Sensor

Ryuji Johnishi,  Hisashi Fukuda,  Sigeru Nomura,  

[Date]2000/8/17
[Paper #]CPM2000-73
CPM2000-74 Structural and Electric Properties of Y_2O_3 Thin Films Formed by Metal-Organic Decomposition

Daisuke MURAKAMI,  Hisashi FUKUDA,  Shigeru NOMURA,  

[Date]2000/8/17
[Paper #]CPM2000-74
CPM2000-75 Structural and electrical properties of thin (1-x)Ta_2O_<5-x>TiO_2 films formed by metalorganic decomposition

K.M.A. Salam,  H. Fukuda,  S. Nomura,  

[Date]2000/8/17
[Paper #]CPM2000-75
CPM2000-76 Influence of heat-treatment on electrical properties of highly conducting RhO2 thin films

K. Kato,  C. Yamamoto,  Y. Abe,  M. Kawamura,  K. Sasaki,  

[Date]2000/8/17
[Paper #]CPM2000-76
CPM2000-77 Growth Technique of Ce YIG Thin Films on Amorphous Substrates

Satoru NOGE,  Takehiko UNO,  

[Date]2000/8/17
[Paper #]CPM2000-77
CPM2000-78 Annealing Effect of ITO Thin Films Deposited at Low Substrate Temperature by Low Voltage Sputtering Technique

Ryoma Ohki,  Yoichi Hoshi,  

[Date]2000/8/17
[Paper #]CPM2000-78
CPM2000-79 Development of High-Capacity Nickel-Metal Hydride Battery"AAA 750"

Minoru KUZUHARA,  Mitsuhiro KODAMA,  Kengo FURUKAWA,  Fangyu CHEN,  Manabu KANEMOTO,  Masaharu WATADA,  Masahiko OSHITANI,  

[Date]2000/8/17
[Paper #]CPM2000-79
CPM2000-80 Extension of Lifetime of Nickel-Metal Hydride Battery as a High-Energy-Density Backup Power Source

Kaoru Asakura,  Harumi Hasui,  Makoto Shimomura,  Toshiro Hirai,  

[Date]2000/8/17
[Paper #]CPM2000-80
CPM2000-81 Electrical properties and interfacial reactions in Al-Mo/n-InP contacts

Mayumi B. TAKEYAMA,  Robina ATSUCHI,  Atushi NOYA,  Tamotsu HASHIZUME,  Hideki HASEGAWA,  

[Date]2000/8/17
[Paper #]CPM2000-81
CPM2000-82 Influence of Hf Film Thickness on the Sequential Single-Oriented Growth of (111)Cu/(111)HfN/(002)Hf Trilayered Film on (001)Si

Y. Kitada,  S. Shinkai,  H. Yanagisawa,  K. Sasaki,  Y. Abe,  

[Date]2000/8/17
[Paper #]CPM2000-82
CPM2000-83 Thermal Stability of Al/ZrN/Zr/Si Contact System Prepared by Interposing Thin ZrN/Zr Bilayered Film

H. Miyake,  H. Yanagisawa,  S. Shinkai,  K. Sasaki,  Y. Abe,  

[Date]2000/8/17
[Paper #]CPM2000-83
[OTHERS]

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[Date]2000/8/17
[Paper #]
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[Date]2000/8/17
[Paper #]