Presentation | |
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Sachiko Taniguchi(Mitsubishi Electric Co.), Yuji Goto(Mitsubishi Electric Co.), Ryusuke Kawate(Mitsubishi Electric Co.), [Date]2016-04-21[Paper #]NS2016-2 | |
Takahiro Fukuno(Univ. of Fukui), Takuji Tachibana(Univ. of Fukui), [Date]2016-04-21[Paper #]NS2016-1 | |
Kensuke Fukuda(NII), [Date]2016-04-21[Paper #]NS2016-5 | |
Shigeto Tajima(Osaka Univ.), Nobuo Funabiki(Okayama Univ.), Teruo Higashino(Osaka Univ.), [Date]2016-04-21[Paper #]NS2016-3 | |
Hiroyuki Inoue(Hiroshima City Univ.), [Date]2016-04-21[Paper #] | |
Hiroyasu Obata(Hiroshima City Univ.), Ryo Hamamoto(Hiroshima City Univ.), Takahiro Matsumoto(Hiroshima City Univ.), Chisa Takano(Hiroshima City Univ.), Kenji Ishida(Hiroshima City Univ.), [Date]2016-04-21[Paper #]NS2016-4 | |
Akihiro Kimura(NTT), Koji Sugisono(NTT), Aki Fukuoka(NTT), Taizo Yamamoto(NTT), [Date]2016-04-22[Paper #]NS2016-12 | |
Takahiro Toda(Osaka Prefecture Univ.), Yosuke Tanigawa(Osaka Prefecture Univ.), Hideki Tode(Osaka Prefecture Univ.), [Date]2016-04-22[Paper #]NS2016-6 | |
Go Hasegawa(Osaka Univ.), Masayuki Murata(Osaka Univ.), [Date]2016-04-22[Paper #]NS2016-10 | |
Masafumi Katoh(FUJITSU LABs), Motoyoshi Sekiya(FUJITSU LABs), Sumie Morita(FUJITSU LABs), Ichiro Iida(FUJITSU LABs), Makoto Murakami(FUJITSU LABs), [Date]2016-04-22[Paper #]NS2016-11 | |
Hiroki Iwasawa(NTT), Kazuhiro Tokunaga(NTT), Kenichi Kawamura(NTT), Naoki Takaya(NTT), [Date]2016-04-22[Paper #]NS2016-8 | |
Tomohiko Kanai(Tokyo Tech), Katsuyoshi Iida(Tokyo Tech), [Date]2016-04-22[Paper #]NS2016-9 | |
Yasuhiro Urayama(University of Fukui), Takuji Tachibana(University of Fukui), [Date]2016-04-22[Paper #]NS2016-13 | |
Shinnosuke Iwagami(Shibaura Inst. Tech.), Taku Yamazaki(Waseda Univ.), Takumi Miyoshi(Shibaura Inst. Tech.), [Date]2016-04-22[Paper #]NS2016-7 |