IEICE Technical Committee

Information and Systems-Dependable Computing(Date:2022/11/28)

Presentation

FPGA Implementation of Learned Image Compression

Heming Sun(Waseda U), Qingyang Yi(UTokyo), Jiro Katto(Waseda U), Masahiro Fujita(UTokyo),

[Date]2022-11-30
[Paper #]VLD2022-53,ICD2022-70,DC2022-69,RECONF2022-76

Prototype and evaluation of 4-input variable logic circuit with FGC using neuron CMOS inverter

Shoma Ito(Tokai Univ.), Daishi Nishiguchi(Tokai Univ.), Masaaki Fukuhara(Tokai Univ.),

[Date]2022-11-30
[Paper #]VLD2022-45,ICD2022-62,DC2022-61,RECONF2022-68

Deep Learning-based Hierarchical Object Detection System for High-Resolution Images

Yusei Horikawa(Nihon Univ.), Makoto Sugaya(Nihon Univ.), Renpei Yoshida(Nihon Univ.), Kazuma Mashiko(Nihon Univ.), Tetsuya Matsumura(Nihon Univ.),

[Date]2022-11-30
[Paper #]VLD2022-44,ICD2022-61,DC2022-60,RECONF2022-67

Evaluation of Model Quantization Method on Vitis-AI for Mitigating Adversarial Examples

Yuta Fukuda(Ritsumeikan Univ.), Kota Yoshida(Ritsumeikan Univ.), Takeshi Fujino(Ritsumeikan Univ.),

[Date]2022-11-30
[Paper #]VLD2022-51,ICD2022-68,DC2022-67,RECONF2022-74

Kota Hisafuru(Waseda Univ.), Nozomu Togawa(Waseda Univ.),

[Date]2022-11-30
[Paper #]VLD2022-54,ICD2022-71,DC2022-70,RECONF2022-77

Proposal of analytical expression for optimal store time of MTJ-based non-volatile flip-flops

Daiki Yokoyama(SIT), Kimiyoshi Usami(SIT), Aika Kamei(Keio Univ.), Hideharu Amano(Keio Univ.),

[Date]2022-11-30
[Paper #]VLD2022-39,ICD2022-56,DC2022-55,RECONF2022-62

On the performance evaluation of a PUF circuit using the Delay Testable Circuit under temperature effects

Eisuke Ohama(Tokushima Univ.), Hiroyuki Yotsuyanagi(Tokushima Univ.), Masaki Hashizume(Tokushima Univ.),

[Date]2022-11-30
[Paper #]VLD2022-46,ICD2022-63,DC2022-62,RECONF2022-69

Design of Digital Phase-Locked Loop Circuit based on 3rd-Order MASH ΔΣ FDC for Low In-Band Phase Noise

Ryoga Iwashita(UTokyo), Zule Xu(UTokyo), Masaru Osada(UTokyo), Ryoya Shibata(UTokyo), Yo Kumano(UTokyo), Tetsuya Iizuka(UTokyo),

[Date]2022-11-30
[Paper #]VLD2022-43,ICD2022-60,DC2022-59,RECONF2022-66

A contact angle estimation method using two coplanar capacitive sensors of different sizes

Tsubasa Furuta(USP), Akira Tsuchiya(USP), Toshiyuki Inoue(USP), Keiji Kishine(USP),

[Date]2022-11-30
[Paper #]VLD2022-42,ICD2022-59,DC2022-58,RECONF2022-65

Evaluation of testing TSVs using the delay testable circuit implemented in a 3D IC

Keigo Takami(Tokushima Univ. Univ.), Hiroyuki Yotsuyanagi(Tokushima Univ.), Masaki Hashizume(Tokushima Univ.),

[Date]2022-11-30
[Paper #]VLD2022-47,ICD2022-64,DC2022-63,RECONF2022-70

FPGA Implementation and Area Evaluation of JTAG Access Mechanism Using Lightweight One-Time Password Authentication Scheme

Hisashi Okamoto(Ehime Univ), Jun Ma(Ehime Univ), Senling Wang(Ehime Univ), Hiroshi Kai(Ehime Univ), Hiroshi Takahashi(Ehime Univ), Akihiro Shimizu(Kochi Univ. of Technology),

[Date]2022-11-30
[Paper #]VLD2022-48,ICD2022-65,DC2022-64,RECONF2022-71

Development of 65nm-Cryo-CMOS Circuit Design Library

Toshitsugu Sakamoto(NBS), Makoto Miyamura(NBS), Kazunori Funahashi(NBS), Koichiro Okamoto(NBS), Munehiro Tada(NBS), Takahisa Tanaka(Tokyo Univ.), Ken Uchida(Tokyo Univ.), Hiroki Ishikuro(Keio Univ.),

[Date]2022-11-30
[Paper #]VLD2022-38,ICD2022-55,DC2022-54,RECONF2022-61

Mask Optimization Using Voronoi Partition and Iterative Improvement

Naoki Nonaka(Univ. of Aizu), Yukihide Kohira(Univ. of Aizu), Atsushi Takahashi(Tokyo Tech), Chikaaki Kodama(KIOXIA),

[Date]2022-11-30
[Paper #]VLD2022-41,ICD2022-58,DC2022-57,RECONF2022-64

A fast SRAF optimization used LUT based intensity estimation

Sota Saito(Tokyo Tech), Atsushi Takahashi(Tokyo Tech),

[Date]2022-11-30
[Paper #]VLD2022-40,ICD2022-57,DC2022-56,RECONF2022-63

Implementation of stereo matching with Kria SOM toward precise field crop height measurement

Ryo Nakagawa(Univ. of Tsukuba), Yoshiki Yamaguchi(Univ. of Tsukuba), Iman Firmansyah(BRIN),

[Date]2022-11-30
[Paper #]VLD2022-52,ICD2022-69,DC2022-68,RECONF2022-75

高速シリアルトランシーバ向けの汎用型ビットエラーテスタの検討

Hisayuki Tamashiro(Ryukyu Univ), Yasunori Osana(Ryukyu Univ),