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Committee Date Time Place Paper Title / Authors Abstract Paper #
SANE 2013-12-02
09:30
Overseas VAST/VNSC(2nd Dec.) & Melia Hotel (3rd Dec), Hanoi, Vietnam Measurement for Permittivity and Thickness of Multilayered Dielectric Plate by Through Radar
Hirokazu Kobayashi (Osaka Institute of Tech.) SANE2013-71
Using wall-through radar, we can obtain image of the front object by means of scanning an antenna mechanically or electr... [more] SANE2013-71
pp.1-6
SANE 2013-08-23
14:55
Niigata Niigata University Igarashi campus Estimation of Equivalent Permittivity and Thickness of Multilayered Dielectric by Wall-through Radar
Hirokazu Kobayashi (Osaka Inst. of Tech.), Shun-ichi Takaoka, Yoshio Yamaguchi (Niigata Univ.), Hong Zhou (Osaka Inst. of Tech.) SANE2013-49
By wall-through radar, we can acquire image of the front object by scanning an antenna mechanically or electrically.In t... [more] SANE2013-49
pp.23-30
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