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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2024-02-28 15:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Locating High Power Consuming Area by Branch and Reconvergence Topology Analysis for Logic Circuit Tomoya Yamashita, Kohei Miyase, Xiaoqing Wen (Kyutech)  DC2023-101 |
In recent years, there has been remarkable progress in the manufacturing technology of LSIs (Large Scale Integration). D... [more] | DC2023-101 pp.41-46 |
| DC | 2023-02-28 16:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Effective Switching Probability Calculation to Locate Hotspots in Logic Circuit Taiki Utsunomiya, Kohei Miyase, Ryu Hoshino (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2022-92 |
High power consumption in LSI testing may cause excessive IR-drop. When IR-drop becomes excessive, it causes excessive d... [more] | DC2022-92 pp.56-61 |
| DC | 2022-03-01 14:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
Evaluation of Efficiency for a Method to Locate High Power Consumption with Switching Provability Ryu Hoshino, Taiki Utsunomiya, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2021-73 |
In recent years, as the high speed and miniaturization of LSIs have improved, it has become more difficult to test LSIs．... [more] | DC2021-73 pp.51-56 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-17 10:30 |
Online | Online | Power Analysis Based on Probability Calculation of Small Regions in LSI Ryo Oba, Ryu Hoshino, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) VLD2020-13 ICD2020-33 DC2020-33 RECONF2020-32 |
Power consumption in LSI testing is higher than in functional mode since more switching activities occur. High power con... [more] | VLD2020-13 ICD2020-33 DC2020-33 RECONF2020-32 pp.12-17 |
| DC | 2020-02-26 15:00 |
Tokyo | Improving Controllability of Signal Transitions in the High Switching Area of LSI Jie Shi, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2019-94 |
Power consumption in LSI testing is larger than in functional mode. High power consumption causes excessive IR-drop and ... [more] | DC2019-94 pp.49-54 |
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| DC | 2019-02-27 10:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Analysis of the hotspot distribution in the LSI Yudai Kawano, Kohei Miyase (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2018-74 |
Performance degrading caused by high IR-drop in normal functional mode of LSI can be solved by improving power supply ne... [more] | DC2018-74 pp.19-24 |
| EMCJ, IEE-SPC, EMD, PEM (Joint) [detail] |
2018-07-26 13:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | ESD evaluation using Optical E-Field Sensor/Optical Voltage Sensor Ryuji Osawa (Seikoh Giken) |
For the immunity test by ESD (Electro-Static Discharge),the test method is internationally specified in IEC61000-4-2. Ma... [more] | |
| EMCJ, IEE-EMC | 2017-12-15 10:45 |
Gifu | Gifu University | Design of Wireless Transceiver for Control Signal Transmission of Myoelectric Artificial Hand and ESD Testing Result Yusuke Murase, Keinosuke Nagai, Daisuke Anzai, Jianqing Wang, Osamu Fujiwara (NIT) EMCJ2017-79 |
Myoelectric artificial hand is expected to be wireless from the viewpoint of improving the convenience. Meanwhile, elect... [more] | EMCJ2017-79 pp.19-24 |
| DC | 2017-02-21 10:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | IR-Drop Analysis on Different Power Supply Network Designs Kohei Miyase, Kiichi Hamasaki (Kyutech), Matthias Sauer (University of Freiburg), Ilia Polian (University of Passau), Bernd Becker (University of Freiburg), Xiaoqing Wen, Seiji kajihara (Kyutech) DC2016-75 |
The shrinking feature size and low power design of LSI make LSI testing very difficult. Further development of LSI techn... [more] | DC2016-75 pp.7-10 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-30 09:25 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | Design of TDC Embedded in Scan FFs for Testing Small Delay Faults Shingo Kawatsuka, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2016-62 DC2016-56 |
With improvement of semiconductor manufacturing process, small delay becomes more important cause of timing failures. ... [more] |
VLD2016-62 DC2016-56 pp.105-110 |
| DC | 2015-06-16 15:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Method to Identify High Test Power Areas in Layout Design Kohei Miyase (Kyutech), Matthias Sauer, Bernd Becker (Univ. Freiburg), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2015-18 |
The problems related to power consumption during at-speed testing is becoming more serious. Particularly, excessive peak... [more] | DC2015-18 pp.13-18 |
| EMCJ, WPT (Joint) |
2014-01-31 15:45 |
Saga | Saga Univ. | A Study on Ensuring Electromagnetic Immunity for Bioelectric Signal Sensors Masayuki Murakami, Takumi Shimizu, Yasuharu Irizuki (TIRI) EMCJ2013-129 |
In the nursing and welfare sector, for supporting the independence of individuals requiring nursing care, devices such a... [more] | EMCJ2013-129 pp.105-110 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2013-11-29 09:45 |
Kagoshima | A Method of High Quality Transition Test Generation Using RTL Information Hiroyuki Nakashima, Satoshi Ohtake (Oita Univ.) VLD2013-94 DC2013-60 |
With the miniaturization and high speed of large scale integrated circuits (VLSIs), it has become important to test dela... [more] | VLD2013-94 DC2013-60 pp.239-244 |
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| EMCJ | 2013-11-22 13:05 |
Tokyo | Tokyo Denki Univ. | Study of IEC ESD Testing for Small-Sized Control Board Ji Cheng, Daisuke Anzai, Jianqing Wang (NIT), Ikuko Mori (SNCT), Osamu Fujiwara (NIT) EMCJ2013-91 |
In conformity with the IEC61000-4-2 standard, we conducted a case study of electrostatic discharge (ESD) tests for a sma... [more] | EMCJ2013-91 pp.1-6 |
| EMCJ | 2013-01-11 15:20 |
Nagasaki | Nagasaki Univ. | Study of an ESD Immunity Test Procedure for Charged Frame Model in Personal Care Robots
-- Requirements for Robot supports -- Masayuki Murakami (TIRI), Hiroyasu Ikeda (JNIOSH) EMCJ2012-120 |
The charged frame ESD is a hazard of mobile robots. When a driving robot is charged by triboelectrification, and its met... [more] | EMCJ2012-120 pp.105-110 |
| EMCJ, IEE-EMC | 2012-12-14 13:20 |
Gifu | Gifu Univ. | Study of an ESD Immunity Test Procedures for Charged Frame Model in Personal Care Robots
-- Consideration of the Test Procedures Specified in the Product Standard of Electrically Powered Wheelchairs -- Masayuki Murakami (TIRI), Hiroyasu Ikeda (JNIOSH) EMCJ2012-94 |
The EMC product standard of electrically powered wheelchairs, ISO 7176-21, requires the charged frame ESD immunity test.... [more] | EMCJ2012-94 pp.55-60 |
| EMCJ | 2009-06-05 11:10 |
Tokyo | Tokyo Big Sight (Tokyo International Exihibition Center) | Study on EMC problem of medical electronic equipment caused by wideband electromagnetic wave-source Kengo Kitaichi (Tokyo City Univ.), Shinobu Ishigami, Kenichi Takizawa, Yasushi Matsumoto, Kiyoshi Hamaguchi (NICT), Masamitsu Tokuda (Tokyo City Univ.) EMCJ2009-25 |
In this study, radiated immunity tests for four kinds of medical electronic equipment, an infusion pump, a syringe pump,... [more] | EMCJ2009-25 pp.19-24 |
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