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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-07 09:25 |
Kumamoto |
Kumamoto-Kenminkouryukan Parea |
On Avoiding Test Data Corruption by Optimal Scan Chain Grouping Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara (KIT), Jun Qian (AMD) VLD2017-42 DC2017-48 |
Scan shift operations cause many gates to switch simultaneously. As a result, excessive IR-drop may occur, disrupting th... [more] |
VLD2017-42 DC2017-48 pp.91-94 |
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