Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SANE |
2023-12-07 15:10 |
Overseas |
Surakarta, Indonesia (Primary: On-site, Secondary: Online) |
Spectral Reflectance Initial Analysis of Bromo Sand for Landsat 9 Calibration Validation Andie Setiyoko, Hendayani, Heri Sulyantara, Ahmad Maryanto, Dianovita, Musyarofah, Bayulodie Vallianto, Kiki Winda Veronica, Ahmad Luthfi Hadiyanto, Suhermanto (BRIN), Rafli Adestia (UI) SANE2023-62 |
This paper aims to conduct a comparative analysis of the reflectance spectral signature of a particular object in a trop... [more] |
SANE2023-62 pp.17-22 |
IMQ, HIP |
2018-07-20 13:30 |
Hokkaido |
Sapporo City University, Satellite Campus |
[Invited Lecture]
Inpainting based on low-dimensional image approximation and its applications Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.) IMQ2018-5 HIP2018-32 |
This paper introduces inpainting based on low-dimensional image approximation and its applications. Specifically, low-di... [more] |
IMQ2018-5 HIP2018-32 pp.1-4 |
SP, SIP, EA |
2017-03-01 12:40 |
Okinawa |
Okinawa Industry Support Center |
[Poster Presentation]
Reflectance Spectra Estimation and Color Reproduction Based on Neugebauer Model Kohei Inoue, Kenji Hara, Kiichi Urahama (Kyushu Univ.) EA2016-95 SIP2016-150 SP2016-90 |
We propose a method for estimating the reflectance spectra of vertex colors of RGB color cube with the reflectance spect... [more] |
EA2016-95 SIP2016-150 SP2016-90 pp.77-82 |
CPM, LQE, ED |
2016-12-12 14:40 |
Kyoto |
Kyoto University |
Characterization of Free-Standing GaN Bulk Substrates by Raman Scattering Spectroscopy and Infrared Reflectance Spectroscopy Kazutaka Kanegae, Mitsuaki Kaneko, Tsunenobu Kimoto, Masahiro Horita, Jun Suda (Kyoto Univ.) ED2016-61 CPM2016-94 LQE2016-77 |
Raman scattering spectroscopy and infrared reflectance spectroscopy were performed on GaN free-standing substrates with ... [more] |
ED2016-61 CPM2016-94 LQE2016-77 pp.21-26 |
IE, ITS, ITE-AIT, ITE-HI, ITE-ME, ITE-MMS, ITE-CE [detail] |
2015-02-23 16:45 |
Hokkaido |
Hokkaido Univ. |
A note on Accurate Estimation of a Light Source and a Spectral Reflectance by Introduction of Superpixel Calculation Method Yuta Igarashi, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.) |
This paper presents a method for estimating a spectral reflectance including near-infrared components. In the proposed m... [more] |
|
OPE, LQE |
2014-12-18 11:05 |
Tokyo |
Kikai-Shinko-Kaikan, NTT Atsugi R&D center |
Fabrication of the 2D metal grating structure for the application to an optical filter and optical characterization Masanori Kito, Atsushi Motogaito, Hideto Miyake, Kazumasa Hiramatsu (Mie Univ.) OPE2014-141 LQE2014-128 |
As heat-ray shielding steps replacing conventional technique, we fabricated the 2D metal grating structure by electron b... [more] |
OPE2014-141 LQE2014-128 pp.11-14 |
LQE, ED, CPM |
2014-11-27 14:30 |
Osaka |
|
Two-Dimensional Strain Mapping of GaN Templates Fabricated by Nano-Channel FIELO Method Using Nanoimprint Lithography Masanori Nambu, Atsushi Yamaguchi (Kanazawa Inst. of Tech.), Hiroki Goto, Haruo Sunakawa, Toshiharu Matsueda (Furukawa Co. Ltd.), Akiko Okada (Waseda Univ.), Hidetoshi Shinohara, Hiroshi Goto (Toshiba Machine Co. Ltd.), Jun Mizuno (Waseda Univ.), Akira Usui (Furukawa Co. Ltd.) ED2014-80 CPM2014-137 LQE2014-108 |
The efficiency droop phenomenon is a big problem for high-brightness white LEDs. It has been pointed out that the proble... [more] |
ED2014-80 CPM2014-137 LQE2014-108 pp.33-38 |
ITS, IE, ITE-AIT, ITE-HI, ITE-ME [detail] |
2014-02-17 10:45 |
Hokkaido |
Hokkaido Univ. |
A note on spectral reflectance estimation using an digital camera including visible and near-infrared spectral sensitivity
-- Introduction of spectrum estimation of a light source -- Yuta Igarashi, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.) |
This paper presents spectral reflectance estimation using a digital camera including visible and near-infrared spectral ... [more] |
|
LQE, ED, CPM |
2011-11-18 10:20 |
Kyoto |
Katsura Hall,Kyoto Univ. |
2D-mapping measurement of residual strain in GaN substrates by micro-reflectance spectroscopy Atsushi Yamaguchi (Kanazawa Inst. Tech.), H. Y. Geng, Haruo Sunakawa, Y. Ishihara, Toshiharu Matsueda, Akira Usui (Furukawa) ED2011-90 CPM2011-139 LQE2011-113 |
We have developed a novel method to precisely measure very small residual strains (~0.01%) in GaN substrates with micron... [more] |
ED2011-90 CPM2011-139 LQE2011-113 pp.87-91 |
ED, LQE, CPM |
2009-11-19 11:40 |
Tokushima |
Univ. of Tokushima (Josanjima Campus, Kogyo-Kaikan) |
Exciton emission mechanism in AlN epitaxial films Takeyoshi Onuma, Kouji Hazu (Tohoku Univ.), Takayuki Sota (Waseda Univ.), Akira Uedono (Univ. of Tsukuba), Shigefusa F. Chichibu (Tohoku Univ.) ED2009-134 CPM2009-108 LQE2009-113 |
Exciton fine structures were observed in partially polarized optical reflectance and cathodoluminescence (CL) spectra of... [more] |
ED2009-134 CPM2009-108 LQE2009-113 pp.31-34 |
PRMU |
2009-10-22 11:00 |
Hiroshima |
Hiroshima Univ. |
PCA-based Reflectance Analysis of Cosmetic Foundation and its Application Yusuke Moriuchi, Takahiko Horiuchi, Shoji Tominaga (Chiba Univ.) PRMU2009-73 |
The present paper describes the detailed analysis of the spectral reflection properties of skin surface with make-up fou... [more] |
PRMU2009-73 pp.13-18 |