IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
MRIS, ITE-MMS 2020-10-05
13:55		 Online Online Switching field and surface control of CoPt based full granular media by utilizing granular cap layer with ferromagnetic grain boundary
Kim Kong Tham, Ryosuke Kushibiki, Tomonari Kamada (Tanaka Kikinzoku), Shin Saito (Tohou Univ.) MRIS2020-2		 Investigation of magnetic properties and nanostructure for full granular media with CoPt-Gd2O3 granular cap layers (CLs)... [more] MRIS2020-2
pp.6-11
ED 2013-10-22
16:30		 Hokkaido Enreisou, Hokkaido Univ. W field emission cathode covered with rare earth oxide mono-layer and transition metal oxide mono-layer -- PEEM analysis and FEM analysis --
Hideaki Nakane, Hiroki Takeda (Muroran Inst. of Tech.), Takashi Kawakubo (KNCT) ED2013-55		 When the apex of tungsten field emitter modified by rare earth oxide or transition metal oxide mono-layer, the work func... [more] ED2013-55
pp.19-22
SDM 2011-07-04
09:00		 Aichi VBL, Nagoya Univ. High Temperature Annealing with MIPS Structure for Improving Interfacial Property at La-silicate/Si Interface and Achieving Scaled EOT
Takamasa Kawanago, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai (Tokyo Tech.) SDM2011-50		 This paper reports our experimental study for further EOT scaling with small interface state density based on controllin... [more] SDM2011-50
pp.1-5
SDM 2010-06-22
13:45		 Tokyo An401・402 Inst. Indus. Sci., The Univ. of Tokyo High Temperature Rapid Thermal Annealing of Rare-Earth Oxides Dielectrics for Highly Scaled Gate Stack of EOT=0.5 nm
Daisuke Kitayama, Tomotsune Koyanagi, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai (Tokyo Inst. of Tech.) SDM2010-41		 A direct contact of high-k/Si substrate (without SiO<sub>2</sub> interfacial layer structure) is required for achieving ... [more] SDM2010-41
pp.43-48
SANE 2006-06-21
16:25		 Ibaraki JAXA(Tsukuba) Greenhouse Gases Monitoring from TANSO on GOSAT
Hiroshi Suto, Akihiko Kuze, Yutaka Kaneko, Takashi Hamazaki (JAXA), Hiroyuki Oguma, Yukio Yoshida, Isamu Morino, Tatsuya Yokota (NIES), Gen Inoue (Nagoya U.) SANE2006-73		 The Greenhouse gases Observing SATellite (GOSAT) is a satellite to monitor the colum concentration of carbon dioxide (CO... [more] SANE2006-73
pp.43-46
 Results 1 - 5 of 5  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan