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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 13 of 13  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
OME 2022-12-19
16:10
Tokyo Katsushika Campus Conductivity and thermal stability of F--doped B-type carbonated apatite-based solid electrolyte
Rei Akamatsu, Yumi Tanaka (Tokyo Univ. of Science) OME2022-49
Motivated by the practical application of FCA ((Ca10-x Na2x/3)[(PO4)6-x(CO3)x][(OH)2-(x/3)-y F y]) as a solid electrolyt... [more] OME2022-49
pp.30-32
CPM, ED, LQE 2022-11-24
11:35
Aichi Winc Aichi (Aichi Industry & Labor Center)
(Primary: On-site, Secondary: Online)
Semiconducting properties of electrochemically deposited Ni(OH)2 thin films
Masahide Shimura, Koji Abe (Nitech) ED2022-28 CPM2022-53 LQE2022-61
Abstract Metal hydroxides are important inorganic materials used as flame retardants and precursors for metal oxide syn... [more] ED2022-28 CPM2022-53 LQE2022-61
pp.23-26
EID, SDM, ITE-IDY [detail] 2020-12-02
14:30
Online Online [Special Invited Talk] Defects control in oxide semiconductors at low-temperature and its application to flexible devices
Yusaku Magari, Mamoru Furuta (Kochi Univ. of Technol.) EID2020-10 SDM2020-44
High-performance In–Ga–Zn–O (IGZO) Schottky diodes (SDs) were fabricated using hydrogenated IGZO (IGZO:H) at a maximum p... [more] EID2020-10 SDM2020-44
pp.37-41
EE, CPM, OME 2018-11-22
09:25
Tokyo Kikai-Shinko-Kaikan Bldg. Effect of anion composition on oxide ion conductionof F-doped B-type carbonatedapatite
Jun Takahata, Yasuhito Sugano, Yumi Tanaka (TUS) EE2018-34 CPM2018-62 OME2018-22
Based on our previous finding that the B-type carbonate apatite (BCA; [Ca10-xNa2x/3][(PO4)6-x(CO3)x] [(H2O)x(OH)2-x/3]) ... [more] EE2018-34 CPM2018-62 OME2018-22
pp.47-49
OME, SDM 2017-04-21
14:05
Kagoshima Tatsugochou Shougaigakushuu Center Charge storage behavior of zirconia ceramics under DC electric field -- Preparation of Y-TZP bioceramics with enhanced LTD durability --
Yumi Tanaka (Tokyo Univ. of Sci.), Hiroyuki Hara (Kyushu Univ.) SDM2017-8 OME2017-8
Yttria-stabilized tetragonal zirconia polycrystal (Y-TZP) is an important load-bearing bioceramic. However, a phenomenon... [more] SDM2017-8 OME2017-8
pp.35-39
OME 2015-12-10
15:40
Tokyo PORTA Kagurazaka [Invited Talk] Anisotropic behavior of ionic conduction in restacked oxide nanosheets
Shinya Suzuki, Masaru Miyayama (UTokyo) OME2015-79
Thin films of lithium-ion-exchanged-montmorillonite (Li-MMT) nanosheets were prepared and their ionic conductivities wer... [more] OME2015-79
pp.25-27
ED 2014-08-01
15:50
Tokyo Kikai-Shinko-Kaikan Bldg. B3-1 Band offset at Al2O3/β-Ga2O3 Heterojunctions
Takafumi Kamimura (NICT), Kohei Sasaki (Tamura Corp.), Man Hoi Wong, Daivasigamani Krishnamurthy (NICT), Akito Kuramata (Tamura Corp.), Takekazu Masui (Koha Co., Ltd.), Shigenobu Yamakoshi (Tamura Corp.), Masataka Higashiwaki (NICT) ED2014-60
The band alignment of Al2O3/n-Ga2O3 (010) was investigated by x-ray photoelectron spectroscopy (XPS). With a band gap of... [more] ED2014-60
pp.41-46
SDM, ED
(Workshop)
2012-06-27
11:30
Okinawa Okinawa Seinen-kaikan [Invited Talk] Gate Stack Technologies for Silicon Carbide Power MOS Devices
Takuji Hosoi, Takashi Kirino, Yusuke Uenishi, Daisuke Ikeguchi, Atthawut Chanthaphan (Osaka Univ.), Akitaka Yoshigoe, Yuden Teraoka (JAEA), Shuhei Mitani, Yuki Nakano, Takashi Nakamura (ROHM), Takayoshi Shimura, Heiji Watanabe (Osaka Univ.)
Silicon carbide (SiC) is a promising material for high-power electronic devices. Although SiO$_2$ dielectric film can be... [more]
CPM 2011-10-27
09:55
Fukui Fukui Univ. Preparation of SiC MOS structure using SiO2 Layer deposited by Thermal Decomposition of TEOS
Mitsunori Hemmi, Yuya Iguchi, Takashi Sakai, Akihiko Sugita, Tomohiko Yamakami, Rinpei Hayashibe, Kiichi Kamimura (Shinshu Univ.) CPM2011-119
A oxide layer was deposited on a SiC surface by thermal chemical vapor deposition as a source material TEOS. After the d... [more] CPM2011-119
pp.51-54
SDM 2009-12-04
11:20
Nara NAIST Characteristics of hot hole injection, trapping, and detrapping in gate oxide of poly-Si TFTs
Yoshinari Kamakura (Osaka Univ.), Takashi Himukashi (Osaka Univ./Kansai Univ.), Hiroshi Tsuji, Kenji Taniguchi (Osaka Univ.) SDM2009-157
The hysteresis observed in the transfer characteristics of n-channel poly-Si TFTs are experimentally investigated and po... [more] SDM2009-157
pp.35-38
EMD 2009-11-20
14:50
Tokyo Nippon Institute of Technology, Kanda Campus, Tokyo, Japan Growth of oxide film on tin plated surface of connector contacts and it effect on contact resistance
Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (ANTech), Terutaka Tamai (Mie Univ.) EMD2009-100
Tin plating has been applied widely to electrical connector contacts to save the cost. However, the tin plated surfaces ... [more] EMD2009-100
pp.133-136
ED 2009-04-23
15:30
Miyagi Tohoku Univ. Ferroelectric-Gate Thin-Film-Transistor Memory Using Epitaxially Grown Composite-Oxide-Film
Yukihiro Kaneko, Hiroyuki Tanaka, Yoshihisa Kato, Yasuhiro Shimada (Panasonic Corp.) ED2009-5
We have developed a ferroelectric-gate thin-film transistor (FeTFT) composed of heteroepitaxially stacked oxide material... [more] ED2009-5
pp.17-22
EMD 2009-03-06
16:35
Tokyo Kougakuin Univ. Growth Law of the Oxide Film Formed on the Tin Plated Contact Surface and Its Contact Resistance Characteristic -- Ellipsometric Study --
Yuya Nabeta, Terutaka Tamai, Yasushi Saitoh, Shigeru Sawada, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AN Technorogies) EMD2008-146
Tin plated contacts has been applied widely to electrical contacts of electromechanical devices as well as gold plated c... [more] EMD2008-146
pp.49-52
 Results 1 - 13 of 13  /   
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