IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 9 of 9  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD 2017-11-17
10:30		 Tokyo The University of Electro-Communications A Method for Evaluating Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism -- Minimal Sliding Amplitudes against Input Waveforms (3) --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2017-44		 The authors obtaine experimental results on the minimal sliding amplitude (MSA) required to make resistances fluctuate o... [more] EMD2017-44
pp.7-12
EMD 2016-11-03
13:55		 Hyogo Awaji Yumebutai International Conference Center Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 2 --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2016-52		 Authors have studied degradation phenomenon on electrical contacts under the influences of an external micro-oscillation... [more] EMD2016-52
pp.11-16
EMD 2015-10-02
16:50		 Saitama Fuji Electric FA Components & SystemCo.,Ltd. Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-66		 Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillat... [more] EMD2015-66
pp.37-42
EMD, R 2015-02-20
15:20		 Shizuoka   A method for evaluating degradation phenomenon of electrical contacts using a micro-sliding mechanisms -- Minimal sliding amplitudes against input waveforms under some conditions --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) R2014-73 EMD2014-110		 Authors have designed and developed a micro-sliding mechanism (MSM1) which causes electronic devices to oscillate direct... [more] R2014-73 EMD2014-110
pp.13-20
EMD 2014-12-19
14:30		 Tokyo Kikai-Shinko-Kaikan Bldg Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-96		 Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] EMD2014-96
pp.7-12
EMD 2014-12-19
14:55		 Tokyo Kikai-Shinko-Kaikan Bldg Degradation phenomenon of electrical contacts by using a micro-sliding mechanism and a hammering oscillation mechanism -- The effect of adding quasi-impulsive oscillation to micro-sliding --
Shin-ichi Wada, Hiroki Iwamoto, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-97		 Authors have designed and developed a hammering oscillation system which gives transient external-force repeatedly to el... [more] EMD2014-97
pp.13-18
EMD 2014-11-30
15:15		 Hokkaido Chitose Cultural Center Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-92		 Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] EMD2014-92
pp.155-160
EMD, LQE, OPE, CPM, R 2014-08-22
16:15		 Hokkaido Otaru Economy Center Degradation Phenomenon of Electrical Contacts by a Micro-Sliding Mechanism -- The comparison of the evaluated minimal sliding amplitudes --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54		 Authors have developed a mechanism which supplies reciprocal micro-sliding to electrical contacts directly driven by a p... [more] R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54
pp.139-144
EMD 2013-01-25
15:25		 Kanagawa Hitachi, Ltd., (Totsuka, Yokohama) Degradation Phenomenon of Electrical Contacts by using Micro-Sliding Mechanisms -- Anallysis of Time-Sequential Fluctuation Data (27) --
Shin-ichi Wada, Keiji Koshida (TMC), Shoko Nagai (Keio), Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-99		 Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] EMD2012-99
pp.9-14
 Results 1 - 9 of 9  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan