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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 12 of 12  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD 2017-11-17
10:30		 Tokyo The University of Electro-Communications A Method for Evaluating Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism -- Minimal Sliding Amplitudes against Input Waveforms (3) --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2017-44		 The authors obtaine experimental results on the minimal sliding amplitude (MSA) required to make resistances fluctuate o... [more] EMD2017-44
pp.7-12
EMD 2015-10-02
16:50		 Saitama Fuji Electric FA Components & SystemCo.,Ltd. Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-66		 Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillat... [more] EMD2015-66
pp.37-42
EMD 2014-12-19
14:30		 Tokyo Kikai-Shinko-Kaikan Bldg Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-96		 Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] EMD2014-96
pp.7-12
EMD 2014-11-30
15:15		 Hokkaido Chitose Cultural Center Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-92		 Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] EMD2014-92
pp.155-160
NLP 2014-03-10
16:10		 Tokyo Sophia University Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (5) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) NLP2013-176		 Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences ... [more] NLP2013-176
pp.67-72
NLP 2013-04-25
10:25		 Aichi Nagoya campus, Chukyo University Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (4) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) NLP2013-2		 Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences ... [more] NLP2013-2
pp.7-12
NLP 2013-03-14
13:50		 Chiba Nishi-Chiba campus, Chiba Univ. Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Thech.) NLP2012-152		 Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] NLP2012-152
pp.43-48
EMD 2012-05-25
14:20		 Miyagi Tohoku Bunka Gakuen Univ. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its Model (21) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-3		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2012-3
pp.13-18
EMD 2012-01-20
13:35		 Kanagawa   Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (20) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-112		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-112
pp.1-6
EMD 2011-12-16
13:55		 Tokyo NIT Kanda Camps Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (19) --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Naoki Masuda, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-108		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-108
pp.11-16
EMD 2011-10-21
12:35		 Tokyo Tachikawa-Shiminn-kaikan Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism -- Contact Resistance (17) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-57
pp.1-6
EMD 2011-05-20
15:50		 Miyagi Tohoku Univ. Cyber-Science Center Degrdation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact resistance --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-7		 Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] EMD2011-7
pp.33-38
 Results 1 - 12 of 12  /   
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