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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| WPT | 2024-03-14 10:40 |
Kyoto | Kyoto-Univ. (Uji campus) (Primary: On-site, Secondary: Online) |
Enhancing Magnetic Field Measurement Accuracy in Wireless Power Transfer Systems Yunchong Tang, Qiaowei Yuan (Tohtech)  WPT2023-37 |
In the development of Wireless Power Transfer (WPT) systems, it is essential to ensure that unwanted radiation meets the... [more] | WPT2023-37 pp.12-15 |
| WPT | 2024-03-15 09:10 |
Kyoto | Kyoto-Univ. (Uji campus) (Primary: On-site, Secondary: Online) |
Novel Microwave Snow Melting Waveguide Utilizing EBG to Prevent Electromagnetic Leakage Koyo Hatazawa, Tamami Maruyama, Akari Kamada, Noa Ebita, Takahiko Nakamura (NIT, Hakodate College), Tsunayuki Yammoto, Nanami Kobayakawa, Fuka Yoshii, Yuna Higasa (NIT, Tsuyama College), Masashi Nakatsugawa (NIT, Hakodate College), Manabu Omiya (Hokkaido University) WPT2023-46 |
This paper introduces a novel snow melting method that involves directing microwaves onto snow without outward electroma... [more] | WPT2023-46 pp.59-62 |
| AP | 2023-10-19 10:00 |
Iwate | Iwate University (Primary: On-site, Secondary: Online) |
[Poster Presentation]
Enhanced Accuracy in AR-based Electromagnetic Field Visualization with Confirming Probe’s Performance Yunchong Tang, Qiaowei Yuan, Norihito Yamato (Tohtech) AP2023-95 |
Visualizing electromagnetic field (EMF) offers an intuitive method for the general public and students to comprehend the... [more] | AP2023-95 pp.37-40 |
| EMD | 2023-03-03 14:45 |
Saitama | NIT and Online (Primary: On-site, Secondary: Online) |
A Study on EBG Absorber for Imaging Electromagnetic Field Distribution using Multi-probe Type. Kento Sakemi, Yoshiki Kayano, Yoshio Kami, Fengchao Xiao (UEC) EMD2022-26 |
In this paper, loop type electromagnetic bandgap absorber for imaging electromagnetic (EM) field distribution using mult... [more] | EMD2022-26 pp.31-34 |
| EMCJ, IEE-EMC, IEE-SPC | 2022-12-07 09:30 |
Aichi | Measurement of Electric Field Distribution Near Brushcutters Using Common Mode Suppression Type Electric Field Probe and High Impedance Attenuator Tessei Mizugai, Atsuhiro Nishikata (Tokyo Tech) EMCJ2022-64 |
The results of electromagnetic field measurements in the vicinity of an engine brushcutter were pre- sented in a previou... [more] | EMCJ2022-64 pp.6-11 |
|
| EMCJ | 2021-07-01 15:00 |
Online | Online | Proposals of Magnetic Field Probes for Detecting the ESD Current Ryota Kobayashi, Tsuyoshi Kobayashi, Yuichi Sasaki (Mitsubishi Electric) EMCJ2021-21 |
EMC designs and countermeasures are significant as the performance of the electronic equipment becomes higher and the sy... [more] | EMCJ2021-21 pp.24-29 |
| SDM, ICD, ITE-IST [detail] | 2018-08-08 12:50 |
Hokkaido | Hokkaido Univ., Graduate School of IST M Bldg., M151 | Measurements and Analysis of Power Supply Noise in Digital IC Chip Kosuke Jike, Akihiro Tsukioka, Ryohei Sawada, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ) SDM2018-39 ICD2018-26 |
Dynamic power noise can be the root cause of electromagnetic compatibility (EMC) problems of electromagnetic interferenc... [more] | SDM2018-39 ICD2018-26 pp.77-82 |
| EMCJ | 2018-07-27 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Measurement of discharge current using shielded-loop probe caused by ESD in spherical electrodes. Masato Oikawa, Kento Kato, Shinobu Ishigami, Ken Kawamata, Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2018-28 |
The relationship between the electromagnetic radiation intensity accompanying the spherical electrode ESD and the peak d... [more] | EMCJ2018-28 pp.37-42 |
| EMCJ, IEE-SPC, EMD, PEM (Joint) [detail] |
2018-07-26 13:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Study on modulation system for optical probe high-frequency magnetic field measurement Kazushi Ishiyama (Tohoku Univ.) |
Measuring magnetic near field is one of the key technologies against the problem of the electromagnetic interference (EM... [more] | |
| ED | 2016-10-25 15:20 |
Mie | Stabilization of spin polarization of field emitted electrons using interlayer antiferromagnetic Cr (001) surface Kento Miyazaki, Naoya Sakai (Mie Univ), Shigekazu Nagai, Tatsuo Iwata, Kazuo Kajiwara, Koichi Hata (Mie Univ/ Mie CUTE) ED2016-47 |
It is important to evaluate spin states at magnetic surfaces for developments of spintronics devices by utilizing both e... [more] | ED2016-47 pp.17-20 |
|
| SCE | 2016-08-09 15:35 |
Saitama | Saitama Univ. (Omiya sonic city) | Analysis of local magnetic field obtained by probe-sample distance modulation in STM-SQUID microscope Yuji Miyato, Tsutau Yokocho (Osaka Univ.) SCE2016-25 |
We have developed an STM-SQUID microscope, in which a scanning tunneling microscope (STM) is combined with a high-Tc rf-... [more] | SCE2016-25 pp.69-73 |
| MW (2nd) |
2016-06-09 - 2016-06-11 |
Overseas | KMUTNB, Bangkok, Thailand | [Poster Presentation]
Planar Near-field to Far-field System for a Small Scattering Object Measurement Sangwon Kittiwittayapong, Kittisak Phaebua, Pinitnai Sittithai, Titipong Lertwiriyaprapa (KMUTNB) |
This paper presents a design of low-cost planar near-field to far-field measurement system for a small antenna and small... [more] | |
| EMCJ, WPT (Joint) |
2016-01-29 09:00 |
Kumamoto | Kumamoto National Colle. Technology | Estimation of transmission line susceptibility to plane wave using BCI test method
-- Theoretical examination -- Misaki Hoshino (Tokai Univ.), Yoshio Kami, Fengchao Xiao (UEC), Majid Tayarani (IUST), Kimitoshi Murano (Tokai Univ.) EMCJ2015-114 |
A bulk current injection (BCI) test is carried out to clarify the conducted immunity of electronic equip-ment for an ext... [more] | EMCJ2015-114 pp.61-64 |
| EMCJ, IEE-EMC | 2015-12-18 15:40 |
Aichi | TOYOTA CENTRAL R&D LABS., INC. | [Special Talk]
RF IC Chip Level Low Noise Technology for Mobile Telecommunication System by Means of Magnetic Materials Masahiro Yamaguchi (Tohoku Univ.) EMCJ2015-101 |
In order to improve signal transfer rate in an RF receiver circuit of a cellular phone handset, developments of high spe... [more] | EMCJ2015-101 pp.69-74 |
| EMCJ | 2015-05-15 13:50 |
Kagawa | Next Kagawa | Development on a Standard Magnetic Field Generator in the Frequency Range below 30 MHz Katsumi Fujii, Kanako Wake (NICT), Masanori Ishii (AIST) EMCJ2015-13 |
A standard magnetic field generator in the frequency range below 30 MHz is proposed to calibrate loop antennas and probe... [more] | EMCJ2015-13 pp.31-36 |
| EMCJ | 2014-07-10 15:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Comparison of Electromagnetic Injection Configurations in terms of Induced Disturbance Observed near Integrated Circuit on Board Kazuhiro Maeshima, Kengo Iokibe (Okayama Univ.), Tetsushi Watanabe (Industrial Technology Center of Okayama Prefecture), Yoshitaka Toyota (Okayama Univ.) EMCJ2014-22 |
In this paper, influence on the noise observed on a board by changing pulse injection configurations. The experiment sys... [more] | EMCJ2014-22 pp.31-36 |
| EMCJ | 2014-04-18 13:55 |
Toyama | Univ. Toyama | Development of High Sensitivity On-chip Active Magnetic Field Probe for IC-chip level RF EM Noise Measurement Yojiro Shigeta, Noriyuki Sato, Kaoru Arai, Masahiro Yamaguchi (Tohoku Univ.), Singo Kageyama (TDC) EMCJ2014-3 |
An on-chip active magnetic field probe having high sensitivity and high spatial resolution simultaneously has been desig... [more] | EMCJ2014-3 pp.13-18 |
| EMCJ, IEE-EMC | 2013-12-20 10:30 |
Aichi | Denso co. | Measurement of Poynting Vector in Automobile Cabin by 3 Axis Magnetic Field Probe Yasuhiro Fukagawa, Shinji Fukui, Shuichi Kono, Tatsuya Ozawa (Nippon Soken,Inc.) EMCJ2013-101 |
Conventional methods used to clarify electromagnetic noise propagation in a vehicle have mainly concentrated on the meas... [more] | EMCJ2013-101 pp.5-8 |
| CPM, LQE, ED | 2013-11-29 16:40 |
Osaka | Evaluation of unwanted radiated emission from GaN-HEMT switching circuit Toshihide Ide, Ryousaku Kaji, Mitsuaki Shimizu (AIST), Kenji Mizutani, Hiroaki Ueno, Nobuyuki Otsuka, Tetsuzo Ueda, Tsuyoshi Tanaka (Panasonic) ED2013-89 CPM2013-148 LQE2013-124 |
The radiated emission from the GaN-HEMT switching converter is investigated by two-dimensional electromagnetic-probe sca... [more] | ED2013-89 CPM2013-148 LQE2013-124 pp.117-120 |
|
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 09:25 |
Miyazaki | NewWelCity Miyazaki | Measurements and Co-Simulation of On-Chip and On-Boad AC Power Noise in Digital Integrated Circuits Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Yoshiyuki Saito (Panasonic), Makoto Nagata (Kobe Univ./CREST,JST) CPM2011-163 ICD2011-95 |
Power noise of an integrated circuit (IC) chip is dominantly characterized by the frequency-domain impedance of a chip-p... [more] | CPM2011-163 ICD2011-95 pp.73-78 |
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