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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| HWS, VLD [detail] | 2020-03-04 16:25 |
Okinawa | Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
Machine Learning Based Lithography Hotspot Detection Method and Evaluation Hidekazu Takahashi, Shimpei Sato, Atsushi Takahashi (Tokyo Tech)  VLD2019-106 HWS2019-79 |
As VLSI device feature sizes are getting smaller and smaller, layout design has become more important to keep the yield... [more] |
VLD2019-106 HWS2019-79 pp.71-76 |
| HWS, VLD [detail] | 2020-03-04 16:50 |
Okinawa | Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
Additional Training Data Generation for Lithography Hotspot Detection by Modifying Existing Training Data Gaku Kataoka, Masato Inagi, Shinobu Nagayama, Shin'ichi Wakabayashi (Hiroshima City Univ.) VLD2019-107 HWS2019-80 |
In lithography, a circuit pattern that is highly likely to cause an undesired open- and short-circuit after transfer is ... [more] | VLD2019-107 HWS2019-80 pp.77-82 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-15 15:45 |
Ehime | Ehime Prefecture Gender Equality Center | Lithography Hotspot Detection Based on Feature Vectors Considering Wire Width and Distance Gaku Kataoka, Masato Inagi, Shinobu Nagayama, Shin'ichi Wakabayashi (Hiroshima City Univ.) VLD2019-51 DC2019-75 |
In lithography, which is one of the semiconductor manufacturing processes, there is a pattern that is highly likely to c... [more] | VLD2019-51 DC2019-75 pp.185-190 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-15 16:10 |
Ehime | Ehime Prefecture Gender Equality Center | Analysis of databases used for hot spot test cases Hiroki Ogura, Hidekazu Takahashi, Sinpei Sato, Atsushi Takahashi (Tokyo Tech) VLD2019-52 DC2019-76 |
With the miniaturization of semiconductor circuit patterns, the importance of photolithography has increased. In the sta... [more] | VLD2019-52 DC2019-76 pp.191-196 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-07 15:40 |
Hiroshima | Satellite Campus Hiroshima | . Tomohiro Totoki (Keio Univ.), Michihiro Koibuchi (NII), Hideharu Amano (Keio Univ.) CPSY2018-43 |
(To be available after the conference date) [more] | CPSY2018-43 pp.59-64 |
| VLD, HWS (Joint) |
2018-03-01 09:00 |
Okinawa | Okinawa Seinen Kaikan | A Study of Lithography Hotspot Detection Method Based on Feature Vectors Considering Distances between Wires Gaku Kataoka, Masato Inagi, Shinobu Nagayama, Shin'ichi Wakabayashi (Hiroshima City Univ.) VLD2017-105 |
In lithography, which is one of the LSI fabrication processes, a layout pattern with a high failure probability is calle... [more] | VLD2017-105 pp.97-102 |
| VLD, HWS (Joint) |
2018-03-01 09:25 |
Okinawa | Okinawa Seinen Kaikan | Efficient Generation of Lithography Hotspot Detector based on Transfer Learning Shuhei Suzuki, Yoichi Tomioka (UoA) VLD2017-106 |
As semiconductor features shrink in size, the fidelity of the layout pattern transferred onto the wafer decreases. A layo... [more] | VLD2017-106 pp.103-108 |
| IA, IN (Joint) |
2017-12-15 10:00 |
Hiroshima | Hiroshima City Univ. | [Invited Talk]
World trends in the Next Generation Hotspot (NGH) and the development of eduroam-on-NGH system Hideaki Goto (Tohoku Univ.) IN2017-60 IA2017-61 |
Next Generation Hotspot (NGH), based on the specification known as Hotspot 2.0 and Passpoint, is being adopted for the p... [more] | IN2017-60 IA2017-61 pp.85-90(IN), pp.49-54(IA) |
| ICTSSL | 2017-03-03 11:00 |
Niigata | Niigata University | Multi agent simulation on change of customer flow line by arrangement of store clerks in home center Kentaro Tani (GIES), Yoshinobu Maeda, Keisuke Nakano (Niigata Univ.), Masakazu Sengoku (GIES) ICTSSL2016-79 |
In recent years, researches using big data of human behavior using wearable sensors have been actively conducted. In th... [more] |
ICTSSL2016-79 pp.49-52 |
| VLD | 2017-03-02 10:55 |
Okinawa | Okinawa Seinen Kaikan | Acceleration of a Hotspot Detection Method Based on Approximate String Matching for LSI Mask Pattern Using Table Reference Shuma Tamagawa, Masato Inagi, Shinobu Nagayama, Shin'ichi Wakabayashi (Hirohima City Univ.) VLD2016-112 |
In nanoscale LSI fabrication, there exists a pattern on the mask pattern, called a hotspot, which leads to a failure. H... [more] |
VLD2016-112 pp.61-66 |
| PRMU, IPSJ-CVIM, MVE [detail] | 2017-01-20 15:35 |
Kyoto | Detection of Hotspots for Machine Operations from First Person Vision Records Chen Long-fei, Kazuaki Kondo, Yuichi Nakamura (Kyoto Univ.), Dima Damen, Walterio W. Mayol-Cuevas (Bristol Univ.) PRMU2016-149 MVE2016-40 |
This paper introduces a novel idea of unsupervised hotspots detection of machine operation in first person vision (FPV) ... [more] | PRMU2016-149 MVE2016-40 pp.339-344 |
|
| ASN, MoNA, MICT (Joint) |
2017-01-19 14:50 |
Oita | Method of simple screening Measurement for Radiation Wireless Monitoring by Applying Non-linear Estimation Yoshitsugu Nakagawa, Chisato Murakami (TIRI), Kazuyuki Mori, Haruhiko Sato (ING) ASN2016-74 |
Five years have passed since the Fukushima nuclear power plant accident, and the decontamination project in disaster are... [more] | ASN2016-74 pp.31-36 |
|
| CS, CQ, NV (Joint) |
2016-04-22 13:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | On a Hybrid Packets-and-Circuits Switching Logic Marat Zhanikeev (Tokyo Univ. of Science) CS2016-8 |
The packets versus circuits argument is several decades old. Back in the day, what we today refer to as all-IP networki... [more] | CS2016-8 pp.43-46 |
| VLD | 2016-03-02 10:55 |
Okinawa | Okinawa Seinen Kaikan | Lithography Hotspot Detection Using Histogram of Oriented Light Propagation Yoichi Tomioka (UoA), Tetsuaki Matsunawa (Toshiba) VLD2015-136 |
In recent semiconductor manufacturing process, it is essential to detect and to remove lithography hotspots, which induc... [more] | VLD2015-136 pp.143-148 |
| CQ, CS (Joint) |
2015-04-21 09:40 |
Fukuoka | Fukuoka Institute of Technology | The Next Generation of Networks is all about Hotspot Distributions and Cut-Through Circuits Marat Zhanikeev (Kyutech) CQ2015-1 |
With BigData and otherwise bulky transfers between data centers, traffic in current networks has turned into a hotspot d... [more] | CQ2015-1 pp.1-4 |
| PRMU | 2014-12-11 13:30 |
Fukuoka | Black Swan Disaster Scenarios Marat Zhanikeev (Kyutech) PRMU2014-72 |
The topic of disaster relief has become very active in Japan since Fukushima in 2011. Various projects are conducted to... [more] | PRMU2014-72 pp.45-48 |
|
| VLD | 2014-03-04 13:20 |
Okinawa | Okinawa Seinen Kaikan | [Invited Talk]
Advanced Model-Based Hotspot Fix Flow for Layout Optimization with Genetic Algorithm Shuhei Sota (Toshiba Microelectronics), Taiga Uno, Masanari Kajiwara, Chikaaki Kodama (Toshiba), Hirotaka Ichikawa (Toshiba Microelectronics), Ryota Aburada, Toshiya Kotani (Toshiba), Kei Nakagawa, Tamaki Saito (Toshiba Microelectronics) VLD2013-148 |
Under the low-k1 lithography process, many hotspots are generated and their reduction is an urgent issue for mass produc... [more] | VLD2013-148 p.85 |
| AP | 2013-04-19 11:35 |
Hyogo | Kwansei Gakuin Univ. | Inside Electric field Measurements with a Diamond-shape Probe for a Solid-eyeball Phantom embedded in a Simplified Human Head Model Manabu Takagi, Yusuke Toyoda, Fumiaki Komori, Tadahiko Maeda (Ritsumeikan Univ.) AP2013-14 |
The conventional method for SAR measurements in assessing the radiation characteristics of a mobile phone is to apply an... [more] | AP2013-14 pp.75-80 |
| RCS, SR, SRW (Joint) |
2013-02-28 15:30 |
Tokyo | Waseda Univ. | [Invited Talk]
Study on Network-cooperated WiFi offload Hidetoshi Yokota, Dae Sun Kim (KDDI Labs) RCS2012-333 SR2012-95 |
(To be available after the conference date) [more] | RCS2012-333 SR2012-95 pp.293-297(RCS), pp.67-71(SR) |
| RCS, NS, USN (Joint) |
2012-07-19 16:10 |
Iwate | Iwate Univ. | [Invited Talk]
IEEE 802.11 based wireless LAN, present and future Masahiro Morikura (Kyoto Univ.) |
This presentation mentions and explains the history and the future use of the IEEE 802.11 based Wireless LANs which had ... [more] | |
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