IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 22  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
CPM, ED, EID, SDM, ICD, MRIS, QIT, SCE, OME, EMD
(Joint) [detail]		 2018-03-08
15:15		 Shizuoka   Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 4 --
Keiji Koshida, Shin-ichi Wada (TMC), Koichiro Sawa (NIT) EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69		 Authors have studied degradation phenomena on electrical contacts under oscillations. In addition, they have developed a... [more] EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69
pp.15-20
EMD 2017-11-17
10:30		 Tokyo The University of Electro-Communications A Method for Evaluating Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism -- Minimal Sliding Amplitudes against Input Waveforms (3) --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2017-44		 The authors obtaine experimental results on the minimal sliding amplitude (MSA) required to make resistances fluctuate o... [more] EMD2017-44
pp.7-12
EMD 2014-12-19
14:05		 Tokyo Kikai-Shinko-Kaikan Bldg An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (8) -- The effect by application time of external force (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-95		 Authors, first, analyse the transient response and steady-state one using theoretical inputs developed by Fourier series... [more] EMD2014-95
pp.1-6
EMD 2014-12-19
14:30		 Tokyo Kikai-Shinko-Kaikan Bldg Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-96		 Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] EMD2014-96
pp.7-12
EMD 2014-11-30
15:15		 Hokkaido Chitose Cultural Center Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-92		 Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] EMD2014-92
pp.155-160
EMD, LQE, OPE, CPM, R 2014-08-22
16:15		 Hokkaido Otaru Economy Center Degradation Phenomenon of Electrical Contacts by a Micro-Sliding Mechanism -- The comparison of the evaluated minimal sliding amplitudes --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54		 Authors have developed a mechanism which supplies reciprocal micro-sliding to electrical contacts directly driven by a p... [more] R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54
pp.139-144
EMD 2012-12-21
15:45		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the hammering oscillating mechanism (26) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling (TMC), Naoki Masuda (TCT), Kunio Yanagi, Hiroaki Kubota (TMC), Masashi Terasaki (TCT), Koichiro Sawa (NIT) EMD2012-95		 Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more] EMD2012-95
pp.27-32
EMD 2012-12-01
14:30		 Chiba Chiba Institute of Technology Degradation phenomenon of electrical contacts using a hammering oscillating mechanism -- A fundamental study on the performance of the oscillating mechanism (25) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2012-86		 Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] EMD2012-86
pp.125-131
EMCJ, EMD 2012-07-20
12:50		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the oscillating mechanism (23) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Kouki Takeda, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2012-41 EMD2012-16		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMCJ2012-41 EMD2012-16
pp.1-6
EMD, CPM, OME 2012-06-22
17:25		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the oscillating mechanism(22) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-15 CPM2012-32 OME2012-39		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2012-15 CPM2012-32 OME2012-39
pp.41-46
EMD 2012-05-25
14:20		 Miyagi Tohoku Bunka Gakuen Univ. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its Model (21) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-3		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2012-3
pp.13-18
EMD 2012-01-20
13:35		 Kanagawa   Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (20) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-112		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-112
pp.1-6
EMD 2011-12-16
13:55		 Tokyo NIT Kanda Camps Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (19) --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Naoki Masuda, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-108		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-108
pp.11-16
EMD 2011-11-18
16:15		 Akita Akita Univ. Tegata Campus Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism -- Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2011-102		 Authors have developed the mechanism which gives damping vibration to electrical contacts by the reciprocal hammering-os... [more] EMD2011-102
pp.189-194
EMD 2011-10-21
12:35		 Tokyo Tachikawa-Shiminn-kaikan Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism -- Contact Resistance (17) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-57
pp.1-6
EMD, EMCJ 2011-07-15
12:20		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts by hammering oscillating mechanism and micro-sliding mechanism -- Contact resistance (16) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2011-61 EMD2011-20		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMCJ2011-61 EMD2011-20
pp.1-6
EMD 2011-05-20
15:50		 Miyagi Tohoku Univ. Cyber-Science Center Degrdation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact resistance --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-7		 Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] EMD2011-7
pp.33-38
EMD 2010-12-17
14:30		 Tokyo Tamagawa University Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (14) --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Professor Emeritus Keio Univ/Nippon Inst. of Tech.) EMD2010-132		 Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] EMD2010-132
pp.17-22
EMD 2010-11-12
13:15		 Overseas Xi'an Jiaotong University A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism -- Modeling (10) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2010-111		 A mechanism which contributes oscillation toward electrical contacts by hammering oscillation mechanism (HOM) in the ver... [more] EMD2010-111
pp.185-188
EMD 2010-10-15
14:35		 Tokyo NTT Musashino Research and Development Center Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (13) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2010-65		 Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the... [more] EMD2010-65
pp.13-18
 Results 1 - 20 of 22  /  [Next]  
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan