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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
NS, RCS
(Joint)		 2023-12-15
17:10		 Fukuoka Kyushu Institute of Technology Tobata campus, and Online
(Primary: On-site, Secondary: Online)		 A Study of Q-drop Identification by Analyzing Receiver-Side Quality Data for Optical Transmission Systems
Kohei Watanabe, Hiroshi Yamamoto, Hiroki Date, Daisaku Shimazaki (NTT), Yutaka Fukuchi, Hideki Maeda (TUS) NS2023-153		 High reliability is required for optical transmission systems, which are widely deployed as the network infrastructure f... [more] NS2023-153
pp.157-162
EMD, R 2021-02-12
15:00		 Online Online [Invited Talk] Reliability physics issues for electronic devices -- Failure mechanisms that still need to be physically clarified --
Yasushi Kadota (RICOH Co.,Ltd.) R2020-37 EMD2020-28		 Many kind of electronic devices, including semiconductor devices, have been using in various fields and applications in ... [more] R2020-37 EMD2020-28
pp.19-24
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2017-03-10
09:30		 Okinawa Kumejima Island Pass/Fail Prediction in LSI Test Considering Fail Die Characteristics.
Takazumi Sato, Michiko Inoue (NAIST) CPSY2016-144 DC2016-90		 Various kinds of tests are applied to LSIs in several satages to ship only fully reliable products.However, a lot of kin... [more] CPSY2016-144 DC2016-90
pp.291-296
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2014-11-28
15:10		 Oita B-ConPlaza A Method of Burn-in Fail Prediction of LSIs Based on Supervised Learning Using Cluster Analysis
Shogo Tetsukawa, Seiya Miyamoto, Satoshi Ohtake (Oita Univ.), Yoshiyuki Nakamura (Renesas) VLD2014-110 DC2014-64		 Production test of LSIs consists of several test phases such as wafer test phase, package test phase, burn-in test phase... [more] VLD2014-110 DC2014-64
pp.251-256
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