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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
IE, ITS, ITE-MMS, ITE-ME, ITE-AIT [detail] 2021-02-19
14:15
Online Online [Special Talk] A Note on Electron Microscope Image Generation from Mix Proportion via Conditional Style Generative Adversarial Network for Rubber Materials
Rintaro Yanagi, Ren Togo, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.)
Estimating the properties of rubber materials from ingredients is necessary to accelerate rubber material development. I... [more]
ITE-HI, IE, ITS, ITE-MMS, ITE-ME, ITE-AIT [detail] 2020-02-27
16:20
Hokkaido Hokkaido Univ.
(Cancelled but technical report was issued)
A Note on Generation of Electron Microscope Images via Auxiliary Classifier Generative Adversarial Network with Mix Proportions
Misaki Kanai, Ren Togo, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.)
In this paper, we investigate a method for generation of images that represent the internal structure of rubber material... [more]
ITS, IE, ITE-MMS, ITE-HI, ITE-ME, ITE-AIT [detail] 2019-02-20
09:15
Hokkaido Hokkaido Univ. A Note on Estimation of Characteristic Curve for Rubber Materials Using Electron Microscope Images and Mix Proportions
Naoki Saito, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.)
This paper presents an estimation method of characteristic curves for rubber materials using electron microscope images ... [more]
IE, ITS, ITE-AIT, ITE-HI, ITE-ME, ITE-MMS, ITE-CE [detail] 2017-02-20
13:00
Hokkaido Hokkaido Univ. A Note on Property Estimation Using Electron Microscope Images and Mix Proportions of Rubbers
Naoki Saito, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.)
In this paper, we propose a property estimation method using electron microscope images and mix proportions of rubber ma... [more]
PRMU 2016-10-21
11:10
Miyazaki   Photometric Stereo by SEM Image Utilizing Region Division
Hiroki Matsuse, Gou Koutaki, Keiichi Uchimura (Kumamoto Univ.), Atsushi Miyamoto (Hitachi) PRMU2016-100
In this paper, we present a three-dimensional (3D) reconstruction method for semiconductor pattern using a scanning elec... [more] PRMU2016-100
pp.55-60
IE, ITS, ITE-AIT, ITE-HI, ITE-ME, ITE-MMS, ITE-CE [detail] 2015-02-23
15:00
Hokkaido Hokkaido Univ. A Note on Image Retrieval Based on Evaluation of Retrieval Results -- An Application to Similarity Evaluation of Surface Structure of Organisms Taken by Scanning Electron Microscope --
Akihiro Takahashi, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.)
This paper presents image retrieval based on evaluation of retrieval results by scanning electron microphotographs (SEM ... [more]
MI 2011-01-20
11:30
Okinawa Naha-Bunka-Tembusu [Poster Presentation] Automatic Extraction of Structures in Electron Microscope Tomography Images
Takahiro Morishita, Ryu Shunshoku (BiGG), Yoshiyuki Kamakura, Mehdi N. Shirazi (OIT) MI2010-112
Extracting structures of interest with accuracy and fast from Electron Microscope tomography images for 3D visualization... [more] MI2010-112
pp.161-165
R 2007-09-14
10:30
Kochi Kochi Univ. of Technology Material Processing by Microplasma in SEM
Hidenori Ohi, Yasuaki Okazaki, Tomoyoshi Takahashi, Akimitsu Hatta (Kochi Univ. Technol.) R2007-29
It has been demonstrated that microplasma was generated in SEM operated under low vacuum mode using micro-gas nozzle for... [more] R2007-29
pp.1-4
ED 2007-08-03
14:20
Osaka   Stabilization of Field emission from nanoneedles with two dimensional graphene sheet structure
Yoichiro Neo (Shizuoka Univ), Takahiro Matsumoto (Stanley Electric Co.), Hidenori Mimura, Makoto Tomita (Shizuoka Univ), Nariyuki Minami (Keio Univ.) ED2007-138
Abstract A stable field emission under a high residual pressure (10-3 Pa) was obtained by the thermal field oeration of... [more] ED2007-138
pp.11-14
CAS, SIP, VLD 2005-06-28
11:15
Miyagi Tohoku University A Scale Estimation Algorithm Based on Phase-Only Correlation for Electron Microscope Images
Sei Nagashima, Takafumi Aoki (Tohoku Univ.), Ruriko Tsuneta (Hitachi, Ltd., Central Reserch Laboratry)
This paper presents a scale estimation algorithm based on Phase-Only Correlation (POC) for electron microscope images. T... [more] CAS2005-18 VLD2005-29 SIP2005-42
pp.19-24
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