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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
LQE, CPM, ED |
2017-12-01 13:20 |
Aichi |
Nagoya Inst. tech. |
Study on degradation of NO2 adsorbed H-terminated diamond MOS FETs by constant voltage stress Yuma Ishimatsu, Kosuke Funaki, Satoshi Masuya, Kyosuke Miyazaki, Takayoshi Oshima, Makoto Kasu, Toshiyuki Oishi (Saga Univ.) ED2017-63 CPM2017-106 LQE2017-76 |
Diamond is expected to be applied to high frequency and high power devices, so far high frequency and high power operati... [more] |
ED2017-63 CPM2017-106 LQE2017-76 pp.69-72 |
EMD, CPM, OME |
2016-06-17 16:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Electrical Measurements on Organic Single Crystals by Using Lamination Contact Electrode Masatoshi Sakai, Yusaku Tada, Taiga Goto, Yugo Okada, Hiroshi Yamauchi, Kazuhiro Kudo (Chiba Univ.) EMD2016-16 CPM2016-23 OME2016-26 |
In this study, we have developed and demonstrated a novel electrical contact method for organic single crystals. Au elec... [more] |
EMD2016-16 CPM2016-23 OME2016-26 pp.43-44 |
EMD |
2010-03-05 16:50 |
Kanagawa |
Yokohama National University |
Observation of Current Flow Point in Contact Surface of Current Correcting Mechanism Shota Ogawa, Yu Zhiling, Hiroki Ryobuchi, Takahiro Ueno (Nippon Inst. of Tech.) EMD2009-141 |
Usually, sliding contact action is used to supply current to a rotating or a moving or a moving object. In addition, it ... [more] |
EMD2009-141 pp.57-60 |
EMD, R |
2010-02-19 15:20 |
Osaka |
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Observation of wear status of tin plating for automotive connector at initial stage of sliding Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Kazuo Iida (Mie Univ.) R2009-56 EMD2009-123 |
Tin plated contacts are widely used for common electrical contact due to the inexpensive and reliability. On the other h... [more] |
R2009-56 EMD2009-123 pp.37-42 |
EMD |
2009-03-06 17:05 |
Tokyo |
Kougakuin Univ. |
Analysis on Contact Surface by FEM Hiroki Ryobuchi, Hironori Karube, Atsuo Suzuki, Tetsuya Komoriya, Noboru Morita, Takahiro Ueno (Nippon Inst. of Tech.) EMD2008-148 |
Usually, sliding contact is normally used to supply current to a rotating or moving object. For example, the real contac... [more] |
EMD2008-148 pp.57-60 |
ED, MW |
2008-01-17 11:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Improvement in reliability of InGaP/GaAs HBT's by ledge passivation Fu-Ying Yang, Shinji Nozaki, Kazuo Uchida, Atsushi Koizumi (UEC) ED2007-217 MW2007-148 |
Because of the exposed heavily carbor-doped GaAs base in the InGaP/GaAs HBT’s, the current gain is significantly reduced... [more] |
ED2007-217 MW2007-148 pp.61-66 |
CPM |
2005-11-11 13:30 |
Fukui |
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Thermal Strain and Temperature Coefficient of Resistance (TCR) of NiCr Thin Films Deposited by Sputtering Satoshi Iwatsubo, Takaaki Shimizu (Toyama Industrial Techonogy Center), Ken Tsubata, Daisuke Kuwahara (HDK), Katsumi Tanino (Toyama Industrial Techonogy Center) |
Temperature Coefficient of Resistance (TCR) is an important property for the film resistance. So far, the factor mainly ... [more] |
CPM2005-152 pp.1-6 |
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