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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 17 of 17  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ED 2015-07-25
11:05
Ishikawa IT Business Plaza Musashi 5F Electron transport characteristics of strain reduced InSb QW structure with AlInSb stepped buffer layer
Tatsuya Taketsuru, Sachie Fujikawa, Yoshiaki Harada, Hiroki Suzuki, Kyousuke Isono, Sanshiro Kato, Daisuke Tuji, Hiroki I. Fujishiro (TUS) ED2015-45
We investigated a high quality novel AlInSb buffer layer to increase the electron mobility of an InSb quantum well (QW) ... [more] ED2015-45
pp.45-49
EMD 2014-12-19
14:55
Tokyo Kikai-Shinko-Kaikan Bldg Degradation phenomenon of electrical contacts by using a micro-sliding mechanism and a hammering oscillation mechanism -- The effect of adding quasi-impulsive oscillation to micro-sliding --
Shin-ichi Wada, Hiroki Iwamoto, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMD2014-97
Authors have designed and developed a hammering oscillation system which gives transient external-force repeatedly to el... [more] EMD2014-97
pp.13-18
SDM, EID 2014-12-12
10:15
Kyoto Kyoto University Impacts of Orientation and Cross-sectional Shape on Mobility of P-channel Si Nanowire MOSFETs
Hiroaki Fujihara, Naoya Morioka, Hajime Tanaka, Jun Suda, Tsunenobu Kimoto (Kyoto Univ.) EID2014-14 SDM2014-109
We fabricated $langle$100$rangle$, $langle$110$rangle$, $langle$111$rangle$, and $langle$112$rangle$ p-channel Gate-All-... [more] EID2014-14 SDM2014-109
pp.7-11
OFT, OCS
(Joint)
2013-08-22
14:50
Hokkaido   Record Low Loss, Record High FOM Optical Fiber with Manufacturable Process
Tetsuya Haruna, Masaaki Hirano, Yoshiaki Tamura, Takehiko Kawano, Satoshi Ohnuki, Yoshinori Yamamoto, Yasushi Koyano, Takashi Sasaki (SEI) OCS2013-38
We newly develop a pure-silica-core fiber (PSCF) with the record-low loss of 0.149 dB/km and an appropriately enlarged e... [more] OCS2013-38
pp.11-16
EMCJ, EMD 2013-07-12
10:35
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts using a Hammering Oscillation Mechanism or a Micro-Sliding Mechanism -- A fundamental study on the performance of the hammering oscillation mechanism (28) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2013-39 EMD2013-24
Authors have studied the effect on electrical contacts by actual micro-oscillation using the hammering oscillation mecha... [more] EMCJ2013-39 EMD2013-24
pp.1-6
EMD, CPM, OME 2013-06-21
14:40
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts by using a Hammering Oscillating Mechanism or a Micro-Sliding Mechanism -- A fundamental study on the performance of the hammering oscillating mechanism (27) --
Shin-ichi Wada, Keiji Koshida, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2013-17 CPM2013-32 OME2013-40
Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more] EMD2013-17 CPM2013-32 OME2013-40
pp.55-60
EMD 2012-12-21
15:45
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the hammering oscillating mechanism (26) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling (TMC), Naoki Masuda (TCT), Kunio Yanagi, Hiroaki Kubota (TMC), Masashi Terasaki (TCT), Koichiro Sawa (NIT) EMD2012-95
Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more] EMD2012-95
pp.27-32
SDM 2011-12-16
16:20
Nara NAIST Shape and Size Effects on Conduction Band Structure of Si Nanowires with Rectangular Cross Section
Seigo Mori, Naoya Morioka, Jun Suda, Tsunenobu Kimoto (Kyoto Univ.) SDM2011-146
We calculated the conduction band structures of [001]- and [110]-oriented Si nanowires with rectangular cross section us... [more] SDM2011-146
pp.77-82
ED 2011-12-14
13:40
Miyagi Tohoku University Monte Carlo Simulations of InGaAs/InAs/InGaAs Composite Channel HEMTs -- Band Structure of Strained InAs and Self-Consistent Analysis of 2DEG --
Akira Endoh (NICT/Fujitsu Labs.), Issei Watanabe (NICT), Takashi Mimura (Fujitsu Labs./NICT) ED2011-101
To achieve high-speed operations of InAlAs/InGaAs HEMTs, an InGaAs/InAs/InGaAs composite layer is usedas a channel. In t... [more] ED2011-101
pp.7-12
SDM 2010-12-17
10:00
Kyoto Kyoto Univ. (Katsura) Bandgap of <100> Si Nanowires Derived from Threshold Voltage of MOSFETs and Theoritical Calculations
Hironori Yoshioka, Naoya Morioka, Jun Suda, Tsunenobu Kimoto (Kyoto Univ.) SDM2010-185
Thin <100> Si-nanowire (Si-NW) MOSFETs were fabricated to characterize the quantum confinement effect in Si NWs. The cro... [more] SDM2010-185
pp.1-6
SDM, ED 2009-06-24
14:30
Overseas Haeundae Grand Hotel, Busan, Korea [Invited Talk] Theoretical study on graphene field-effect transistors
Eiichi Sano (Hokkaido Univ./JST), Taiichi Otsuji (Tohoku Univ../JST) ED2009-62 SDM2009-57
Graphene is one of the most attractive materials for“beyond CMOS” electronics. We investigate graphene-layer composition... [more] ED2009-62 SDM2009-57
pp.53-58
SDM, ED 2009-02-27
09:50
Hokkaido Hokkaido Univ. Silicon Nanowire pMOSFETs and Single-Hole Transistors at Room Temperature under Uniaxial Strain
YeonJoo Jeong, Chen Jiezhi, Takuya Saraya, Toshiro Hiramoto (Univ. of Tokyo) ED2008-234 SDM2008-226
Uniaxial strain effects on NW pFET and SHT are investigated. In the NW pFET, considerably larger current modulation tha... [more] ED2008-234 SDM2008-226
pp.59-62
SDM [detail] 2008-11-14
16:40
Tokyo Kikai-Shinko-Kaikan Bldg. First-Principles Simulation of Electronic Bandstructures on Nanoscaled-Si Channels with Strain Effects
Tadashi Maegawa, Tsuneki Yamauchi, Takeshi Hara, Hideaki Tsuchiya, Matsuto Ogawa (Kobe Univ.) SDM2008-183
In this paper, we present a comparative computational study on strain effects in Si nanostructures including bulk, thin ... [more] SDM2008-183
pp.83-88
SDM 2008-06-09
15:50
Tokyo An401・402, Inst. Indus. Sci., The Univ. of Tokyo HoleSubband Dispersion in Si inversion Layers
Sakura N. Takeda, Makoto Morita, Takuya Ohsugi, Yohei Tanigawa, Hiroshi Daimon (NAIST) SDM2008-44
Subband dispersion quantized in Si inversion layer was measured by Angle-resolved photoemission spectroscopy.
The dispe... [more]
SDM2008-44
pp.13-16
SDM 2008-06-09
16:50
Tokyo An401・402, Inst. Indus. Sci., The Univ. of Tokyo Inversion-Layer Capacitance and Low-Field Mobility Characteristics in Si(110) pMOSFETs
Masumi Saitoh, Shigeki Kobayashi, Ken Uchida (Toshiba) SDM2008-46
Basic transport properties of Si (110) pMOSFETs are systematically investigated. Inversion-layer capacitance of (110) p... [more] SDM2008-46
pp.23-27
OME 2007-05-18
13:25
Tokyo Denki-Club Potential Fluctuation and its Origin in Crystalline Domain of Pentacene Thin-Film Transistors
Noboru Ohashi, Hiroshi Tomii, Ryousuke Matsubara, Masakazu Nakamura, Masatoshi Sakai, Kazuhiro Kudo (Chiba Univ.) OME2007-10
Surface topography and potential distribution of a thin-film transistor (TFT) with a poly-crystalline pentacene active l... [more] OME2007-10
pp.5-9
OME, EID 2007-03-05
13:25
Tokyo Kikai-Shinko-Kaikan Bldg Lateral carrier conduction in pentacene polycrystalline films -- The hole transport barrier and the effective mass in crystals --
Ryousuke Matsubara (Chiba Univ.), Masakazu Nakamura (Chiva Univ.), Kazuhiro Kudo (Chiba Univ.)
Characteristics of organic thin-film-transistors (OTFTs) are limited by various effects originated from the electrode. W... [more] OME2006-133 EID2006-90
pp.7-11
 Results 1 - 17 of 17  /   
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