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Committee Date Time Place Paper Title / Authors Abstract Paper #
CPSY, DC, IPSJ-ARC [detail] 2022-07-27
09:45		 Yamaguchi Kaikyo Messe Shimonoseki
(Primary: On-site, Secondary: Online)
Enrei Jo, Rei Miura, Toshinori Hosokawa (Nihon Univ), Masayosi Yoshimura (KSU) CPSY2022-1 DC2022-1		 In recent years, with the low power design of VLSIs, many low power oriented don't care (X) identification methods and X... [more] CPSY2022-1 DC2022-1
pp.1-6
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2014-11-28
10:05		 Oita B-ConPlaza A Test Point Insertion Method to Reduce Capture Power Dissipation
Yoshiyasu Takahashi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) VLD2014-99 DC2014-53		 In at-speed scan testing of deep sub-micron era, high power dissipation can occur by high launch-induced switching activ... [more] VLD2014-99 DC2014-53
pp.185-190
DC 2012-02-13
14:25		 Tokyo Kikai-Shinko-Kaikan Bldg. A method to reduce the number of test patterns for transition faults using control point insertions
Akihiko Takahashi, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushu Univ) DC2011-82		 In recent year, the growing density and complexity for VLSIs cause an increase in the number of test patterns. Moreover,... [more] DC2011-82
pp.37-42
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2009-12-04
13:25		 Kochi Kochi City Culture-Plaza A Test Compaction Oriented Don't Care Identification Method
Motohiro Wakazono, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) VLD2009-62 DC2009-49		 In recent year, the growing density and complexity for VLSIs cause an increase in the number of test pattern and an incr... [more] VLD2009-62 DC2009-49
pp.149-154
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