| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| CPSY, DC, IPSJ-ARC [detail] | 2022-10-12 14:00 |
Niigata | Yuzawa Toei Hotel (Primary: On-site, Secondary: Online) |
A Don't Care Filling Algorithm of Control Signals for Concurrent Testing Xu Haofeng, Hosokawa Toshinori (Nihon Univ.), Yoshimura Masayoshi (KSU), Arai Masayuki (Nihon Univ.)  CPSY2022-24 DC2022-24 |
In recent years, with the increase in test cost for VLSIs, it has been important to reduce the number of test patterns. ... [more] | CPSY2022-24 DC2022-24 pp.37-42 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-07-27 09:45 |
Yamaguchi | Kaikyo Messe Shimonoseki (Primary: On-site, Secondary: Online) |
Enrei Jo, Rei Miura, Toshinori Hosokawa (Nihon Univ), Masayosi Yoshimura (KSU) CPSY2022-1 DC2022-1 |
In recent years, with the low power design of VLSIs, many low power oriented don't care (X) identification methods and X... [more] | CPSY2022-1 DC2022-1 pp.1-6 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2022-03-10 10:30 |
Online | Online | A Don't Care Filling Method of Control Signals for Concurrent Logical Fault Testing Haofeng Xu, Toshinori Hosokawa, Hiroshi Yamazaki, Masayuki Arai (Nihon Univ), Masayoshi Yoshimura (KSU) CPSY2021-56 DC2021-90 |
In recent years, with the increase in test cost for VLSIs, it has been important to reduce the number of test patterns. ... [more] | CPSY2021-56 DC2021-90 pp.67-72 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2014-11-28 10:05 |
Oita | B-ConPlaza | A Test Point Insertion Method to Reduce Capture Power Dissipation Yoshiyasu Takahashi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) VLD2014-99 DC2014-53 |
In at-speed scan testing of deep sub-micron era, high power dissipation can occur by high launch-induced switching activ... [more] | VLD2014-99 DC2014-53 pp.185-190 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 16:00 |
Fukuoka | Centennial Hall Kyushu University School of Medicine | A Method to Estimate the Number of Don't-Care Bits with Netlist Kohei Miyase, Seiji Kajihara, Xiaoqing Wen (KIT) VLD2012-104 DC2012-70 |
X-filling is often utilized so as to achieve test compression, test power reduction, or test quality improvement etc. i... [more] |
VLD2012-104 DC2012-70 pp.261-266 |
| DC | 2012-06-22 13:00 |
Tokyo | Room B3-1 Kikai-Shinko-Kaikan Bldg | An evaluation of a don't care filling method to improve fault sensitization coverage Ryosuke Wakasugi, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyusyu Univ) DC2012-9 |
A single stuck-at fault model and a transition fault model have been widely used to generate test patterns for VLSIs. Ho... [more] | DC2012-9 pp.1-6 |
[Return to Top Page]