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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 17 of 17  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2020-12-11
13:00
Hyogo
(Primary: On-site, Secondary: Online)
A Degradation Prediction of Circuit Delay Using A Gradient Descent Method
Seiichirou Mori, Masayuki Gondou, Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech) DC2020-59
As the risk of aging-induced faults of VLSIs is increasing, highly reliable systems require to predict when the aging-in... [more] DC2020-59
pp.1-6
DC 2019-12-20
16:30
Wakayama   Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test
Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] DC2019-85
pp.37-42
R 2019-11-28
16:25
Osaka Central Electric Club Reliability Methodologies for Degradation Predictions Based on Hierarchical Bayesian Modeling and Machine Learning
Toru Kaise, Toyohiko Egami (Univ. of Hyogo) R2019-49
Degradation processes are significant for making values of reliability.
Particularly, it is known that stochastic model... [more]
R2019-49
pp.35-38
CPM, ED, EID, SDM, ICD, MRIS, QIT, SCE, OME, EMD
(Joint) [detail]
2018-03-08
15:15
Shizuoka   Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 4 --
Keiji Koshida, Shin-ichi Wada (TMC), Koichiro Sawa (NIT) EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69
Authors have studied degradation phenomena on electrical contacts under oscillations. In addition, they have developed a... [more] EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69
pp.15-20
EE 2018-01-30
13:35
Oita Satellite Campus Oita Failure Prediction Using Low Stability Phenomenon of Digitally Controlled SMPS by Electrolytic Capacitor ESR Degradation
Hiroshi Nakao, Yu Yonezawa, Yoshiyasu Nakashima (Fujitsu LAB), Fujio Kurokawa (NiAS) EE2017-71
Electrolytic capacitors are known as one of the highest failure rate components in switching mode power supply SMPS). We... [more] EE2017-71
pp.165-170
OME, SDM 2017-04-21
14:05
Kagoshima Tatsugochou Shougaigakushuu Center Charge storage behavior of zirconia ceramics under DC electric field -- Preparation of Y-TZP bioceramics with enhanced LTD durability --
Yumi Tanaka (Tokyo Univ. of Sci.), Hiroyuki Hara (Kyushu Univ.) SDM2017-8 OME2017-8
Yttria-stabilized tetragonal zirconia polycrystal (Y-TZP) is an important load-bearing bioceramic. However, a phenomenon... [more] SDM2017-8 OME2017-8
pp.35-39
EMD 2015-10-02
16:50
Saitama Fuji Electric FA Components & SystemCo.,Ltd. Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-66
Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillat... [more] EMD2015-66
pp.37-42
EMD, R 2015-02-20
15:20
Shizuoka   A method for evaluating degradation phenomenon of electrical contacts using a micro-sliding mechanisms -- Minimal sliding amplitudes against input waveforms under some conditions --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) R2014-73 EMD2014-110
Authors have designed and developed a micro-sliding mechanism (MSM1) which causes electronic devices to oscillate direct... [more] R2014-73 EMD2014-110
pp.13-20
EMD 2013-11-16
09:30
Overseas Huazhong University of Science and Technology, Wuhan, P.R.China An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board -- Properties of the Responses using Rectangular Wave and Sinusoidal one as an Input --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-78
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] EMD2013-78
pp.15-18
EMD 2013-11-16
09:45
Overseas Huazhong University of Science and Technology, Wuhan, P.R.China An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board -- Natural Frequency and Damping Ratio (2) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-79
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] EMD2013-79
pp.19-22
EMD 2012-12-01
14:30
Chiba Chiba Institute of Technology Degradation phenomenon of electrical contacts using a hammering oscillating mechanism -- A fundamental study on the performance of the oscillating mechanism (25) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2012-86
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] EMD2012-86
pp.125-131
VLD 2012-03-07
09:15
Oita B-con Plaza A Power Grid Optimization Algorithm Considering by NBTI
Yoriaki Nagata, Masahiro Fukui (Ritsumeikan Univ.), Shuji Tsukiyama (Chuo Univ.) VLD2011-132
With the advent of super deep submicron age and high integration, the circuit was concerned about the impact of timing ... [more] VLD2011-132
pp.73-78
EMD 2011-11-18
16:15
Akita Akita Univ. Tegata Campus Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism -- Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2011-102
Authors have developed the mechanism which gives damping vibration to electrical contacts by the reciprocal hammering-os... [more] EMD2011-102
pp.189-194
NLP 2011-03-11
16:35
Tokyo Tokyo University of Science A Study of Degradatuion Phenomenon of electrical Contacts by some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Tohru Ikeguchi (Saitama Univ.), Yoshihiko Horio (Tokyo Denki Univ.), Koichiro Sawa (Nippon Insti. of Tech.) NLP2010-196
The authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences o... [more] NLP2010-196
pp.187-192
EMD 2010-11-12
13:15
Overseas Xi'an Jiaotong University A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism -- Modeling (10) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2010-111
A mechanism which contributes oscillation toward electrical contacts by hammering oscillation mechanism (HOM) in the ver... [more] EMD2010-111
pp.185-188
EMD, OPE, LQE, CPM 2010-08-26
09:20
Hokkaido Chitose Arcadia Plaza Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism (9) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Thech.) EMD2010-26 CPM2010-42 OPE2010-51 LQE2010-24
The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studi... [more] EMD2010-26 CPM2010-42 OPE2010-51 LQE2010-24
pp.1-6
EMD 2010-05-21
14:50
Akita Akita Univ. Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism (8) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2010-4
The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studi... [more] EMD2010-4
pp.19-24
 Results 1 - 17 of 17  /   
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