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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| NS, IN (Joint) |
2022-03-11 10:40 |
Online | Online | Measurement Route Design Using Bayesian Optimization for Degraded Area Detection in Ultra-dense Networks Kotaro Matsuda, Hiroki Ikeuchi, Yousuke Takahashi, Akio Watanabe (NTT)  IN2021-40 |
In ultra-dense wireless networks after 5G/6G, communication degradation is expected to increase. On the other hand, the ... [more] | IN2021-40 pp.55-60 |
| IA, SITE, IPSJ-IOT [detail] | 2022-03-07 10:10 |
Kyoto | Kyoto University, Yoshida Campus (Primary: On-site, Secondary: Online) |
On the detectability of traffic reduction caused by QoS degradation Keisuke Ishibashi (ICU), Takumi Uchida (ComWorth) SITE2021-48 IA2021-61 |
In this paper, we discuss the possibility of detecting the event of traffic reduction due to QoS degradation. This event... [more] | SITE2021-48 IA2021-61 pp.15-18 |
| DC | 2022-03-01 10:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
On Correction for Temperature and Voltage Effects in On-Chip Delay Measurement Takaaki Kato (KIT), Yousuke Miyake (PRIVATECH), Seiji Kajihara (KIT) DC2021-67 |
It is effective for aging of a logic circuit to measure a circuit delay periodically in field. In order to compare the d... [more] | DC2021-67 pp.18-23 |
| EE | 2021-01-25 10:55 |
Online | Online (Zoom) | Aged Deterioration Detection of DC-DC Converter Yasuyuki Koga (NiAS), Yudai Furukawa (Fukuoka University), Kazuhiro Kajiwara, Nobumasa Matsui, Fujio Kurokawa (NiAS), Yoshiyasu Nakashima, Yu Yonezawa (FUJITSU Advanced Technology) EE2020-27 |
In recent years, information and communication services have continued to develop, and the power supply is one of their ... [more] | EE2020-27 pp.22-26 |
| DC | 2019-12-20 16:30 |
Wakayama | Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] | DC2019-85 pp.37-42 |
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| IN, NS (Joint) |
2019-03-05 14:10 |
Okinawa | Okinawa Convention Center | Efficient Alternative Route Detection under Unknown Failure on SDN Network by Failure Probability Takumi Matsuura (Tokyo Tech), Hiroki Nakayama, Tsunemasa Hayash (BOSCO), Katsunori Yamaoka (Tokyo Tech) IN2018-141 |
In the network, the unknown failure which is hard to recover is called silent failure. To identify a failure point is so... [more] | IN2018-141 pp.343-348 |
| EE | 2018-01-30 13:35 |
Oita | Satellite Campus Oita | Failure Prediction Using Low Stability Phenomenon of Digitally Controlled SMPS by Electrolytic Capacitor ESR Degradation Hiroshi Nakao, Yu Yonezawa, Yoshiyasu Nakashima (Fujitsu LAB), Fujio Kurokawa (NiAS) EE2017-71 |
Electrolytic capacitors are known as one of the highest failure rate components in switching mode power supply SMPS). We... [more] | EE2017-71 pp.165-170 |
| NS, IN (Joint) |
2017-03-03 09:10 |
Okinawa | OKINAWA ZANPAMISAKI ROYAL HOTEL | A Method of Fast Detection of Alternative Route under Unknown Failure on SDN Network Takumi Matsuura (Tokyo Tech), Hiroki Nakayama, Tsunemasa Hayashi (BOSCO), Katsunori Yamaoka (Tokyo Tech) IN2016-122 |
In the network, the unknown failure which is hard to reproduce is well-known, and it is called silent failure.Although s... [more] | IN2016-122 pp.151-156 |
| IMQ | 2011-09-02 15:25 |
Shizuoka | Shizuoka University (Hamamatsu) | Non-reference estimation method of image quality summarizing four kinds of detection for the coded degradation Takayuki Suzuki, Naoya Sagara, Kenji Sugiyama (Seikei Univ.) IMQ2011-12 |
In the many kinds of video system, it is desired that the picture quality is controlled to provide the better picture. F... [more] | IMQ2011-12 pp.23-26 |
| EMD, R | 2011-02-18 15:00 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Detection of degradation sign of LSI operation using IDDQ Shunsuke Sakamoto, Masaru Sanada (KUT) R2010-46 EMD2010-147 |
VDD supply current (IDDQ) information has been applied to detect LSI evaluation technology, IDDQ which has high fault de... [more] | R2010-46 EMD2010-147 pp.25-30 |
| IN, NS (Joint) |
2009-03-03 10:50 |
Okinawa | Okinawa-Zanpamisaki Royal Hotel | Detection Method for Network Quality Degradation by using network Characteristics Nobuyuki Nakamura, Satoshi Ikada, Norihiro Imanaka, Toshihisa Nakai (Oki Electric Industry Co.,Ltd.) IN2008-160 |
It’s difficult for network operators to assure Quality of Services which are required very high bit rate and low packet ... [more] | IN2008-160 pp.167-172 |
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