IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 15 of 15  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2021-10-22
14:25
Online Online [Invited Talk] Field Lifetime Data Analysis with Left-truncation and Right-censoring -- Statistical Inference and Reliability Prediction based on Parametric Models --
Takeshi Emura (Kurume Univ.), Hirofumi Michimae (Kitasato Univ.) R2021-31
In applications of reliability analyses, a dataset may be collected during a period of time to observe failure events. L... [more] R2021-31
pp.7-12
R 2016-11-17
14:00
Osaka Osaka Central Electric Club Bldg. Estimation of three parameters of Weibull distribution by a discretization mdel
Kenji Uogishi R2016-49
It is divided in fixed period of time such as days or months and the statistics information that the observation numeric... [more] R2016-49
pp.1-6
R 2016-11-17
14:25
Osaka Osaka Central Electric Club Bldg. Software Reliability Analysis Based on Machine Learning
Toru Kaise (Univ. of Hyogo) R2016-50
Software debugging processes are made to be effective by managing methods with reliability evaluations. The reliability ... [more] R2016-50
pp.7-11
EMD 2015-11-05
16:25
Miyagi Tohoku University, School of engineering, Aoba memorial hall Behavior of Terminal Resistance and Deterioration Prediction of Terminal Resistance with Connectors Used in Long Driven Vehicles
Shigeru Sawada, Atsushi Shimizu, Yasushi Saitoh (ANtech) EMD2015-72
It is an important issue to investigate the deterioration state of connectors used in long driven vehicles in order to d... [more] EMD2015-72
pp.29-34
R 2013-12-13
14:35
Tokyo   A Comparative Study of NHPP-based Software Reliability Models with Exponentiated Distributions
Xiao Xiao (Tokyo Metropolitan Univ.), Tadashi Dohi (Hiroshima Univ.) R2013-82
The non-homogeneous Poisson processes (NHPPs) based software reliability models (SRMs) have gained much popularity in ac... [more] R2013-82
pp.19-24
R 2012-05-25
15:45
Shimane   On the Role of Weibull-type Distributions in Binomial Software Reliability Modeling
Xiao Xiao, Tadashi Dohi (Hiroshima Univ.) R2012-7
The binomial software reliability model (SRM) is one of the most classical but plausible SRMs, and can describe many sof... [more] R2012-7
pp.35-40
SANE 2011-01-27
16:25
Nagasaki Nagasaki Prefectural Art Museum A Study on Simulation for Clutter Suppression for UWB Vehicle Radar at 24GHz
Isamu Matsunami, Masatoshi Ogata, Masami Kawazoe, Yoshio Kosuge (Nagasaki Univ.), Akihiro Kajiwara (Kitakyushu Univ.) SANE2010-145
Recent year, 24/26GHz UWB radar is attracting the attention as short-range and wide-angle radar, which achieve surround ... [more] SANE2010-145
pp.43-47
WBS, ITS
(Joint)
2010-12-06
10:25
Ibaraki AIST Improvement of Target Detection Performance Considering Clutter Characteristics for UWB Vehicle Radar at 24GHz
Isamu Matsunami (Nagasaki Univ.), Akihiro Kajiwara (Kitakyushu Univ.) WBS2010-36
Radar echo contains unwanted echoes called as clutter, which make it difficult to detect some obstacle or target. Theref... [more] WBS2010-36
pp.7-11
R 2010-05-28
12:55
Tottori   Reliability data analysis for quality improvement of automotive rubber products
Naofumi Wada, Ryoma Takagi, Shigeru Yamada (Tottori Univ.) R2010-8
In this paper, we discuss the materials which called “Resin slide materials” which use on a glass-run-channel for automo... [more] R2010-8
pp.7-12
R 2009-07-31
16:00
Hokkaido   A Study of Estimation for the Three-ParameterWeibull Distribution under Singly Censored Data
Hideki Nagatsuka (Tokyo Metropolitan Univ.), Toshinari Kamakura (Chuo Univ.), Tsunenori Ishioka (NCUEE), Hisashi Yamamoto (Tokyo Metropolitan Univ.) R2009-30
Efficient methods for parameter estimation of the three-parameter Weibull distribution under censored data have not exis... [more] R2009-30
pp.47-51
EMD 2009-07-17
15:20
Hokkaido Chitose Arcadia Plaza An experimental study on analysis of contact resistance data with Weibull distribution function
Makoto Hasegawa (Chitose Inst. of Sci. and Tech.) EMD2009-25
In order to realize detailed analysis of measured contact resistance data, fitting of Weibull distribution function to c... [more] EMD2009-25
pp.25-30
R 2008-06-20
13:25
Tokyo Kikai-Shinko-Kaikan Bldg. A consideration on estimation of the Weibull parameters
Hideki Nagatsuka (Tokyo Metropolitan Univ.), Toshinari Kamakura (Chuo Univ.) R2008-16
Two methods for parameter estimation of the three-parameter Weibull distribution are proposed. In the both methods, the ... [more] R2008-16
pp.9-14
R, SSS 2006-12-15
14:55
Tokyo Kikai-Shinko-Kaikan Bldg. Parameter estimation for lifetime distributions free from location information
Hideki Nagatsuka (Tokyo Metropolitan Univ.)
Weibull distribution and gamma distribution, having location (threshold), scale and shape parameters, are used as models... [more] R2006-43 SSS2006-24
pp.25-30
R 2006-05-26
13:25
Tokushima University of Tokushima Software Reliability Modeling Based on A Discrete Weibull-Type Failure-Occurrence Times Distribution
Shinji Inoue, Shigeru Yamada (Tottori Univ.)
Unified modeling frameworks for software reliability growth models (SRGM's) are known as the frameworks for treating exi... [more] R2006-8
pp.7-12
OPE, R, CPM 2005-04-22
15:20
Tokyo Kikai-Shinko-Kaikan Bldg. Fatigue characteristics of the Si moveable comb inserted into MEMS optical devices
Takayuki Shimazu, Makoto Katayama (SEI), Yoshitada Isono (Rits)
This paper focuses on the fatigue characteristics of the single crystal silicon (SC-Si) cantilever in relation with the ... [more] R2005-6 CPM2005-6 OPE2005-6
pp.29-32
 Results 1 - 15 of 15  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan