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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
PRMU, IBISML, IPSJ-CVIM [detail] |
2011-09-06 11:30 |
Hokkaido |
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Efficient Learning for Successive TFC by Selective Assessment for defect Classification Yoshikazu Matsuo (Hokkaido Univ.), Takamichi Kobayashi (NSC), Hidenori Takauji (MIT), Shun'ichi Kaneko (Hokkaido Univ.) PRMU2011-75 IBISML2011-34 |
We had proposed the method Test Feature Classifier(TFC) as a Nonparametoric Classifier and Successive TFC(sTFC). We prop... [more] |
PRMU2011-75 IBISML2011-34 pp.151-156 |
PRMU |
2009-03-14 13:45 |
Miyagi |
Tohoku Institute of Technology |
Analysis of maturing for Successive Test Feature Classifier Yoshikazu Matsuo (Hokkaido Univ.), Takamichi Kobayashi (Nippon Steel.), Hidenori Takauji, Shun'ichi Kaneko (Hokkaido Univ.) PRMU2008-274 |
In the Test Feature Classifier(TFC), Successive Test Feature
Classifier(sTFC) which method enable to create higher
q... [more] |
PRMU2008-274 pp.229-234 |
R |
2008-10-17 16:15 |
Fukuoka |
Kyusyu Institute of Technology |
Diagnosis Accuracy in Electric Power Apparatuses Conditions using the Classification Methods Hideo Hirose, Faisal M. Zaman, Kotaro Tsuru (Kyushu Inst. of Tech.), Toshihiro Tsuboi, Shimitsu Okabe (Tokyo Electric Power) R2008-34 |
To diagnose the electric power apparatus, the use of the decision tree method was recommended as a classification tool b... [more] |
R2008-34 pp.39-44 |
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