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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
EID, SDM, ITE-IDY [detail] 2020-12-02
15:00		 Online Online Coexistence of digital and analog resistive switching in Ta2O5-based ReRAM cells with TiN electrodes.
Kazutaka Yamada, Tsunenobu Kimoto (Kyoto Univ.), Yusuke Nishi (Kyoto Univ./NIT, Maizuru College) EID2020-11 SDM2020-45		 In this study, we have investigated the resistive switching (RS) characteristics of Ni/Ta2O5/TiN stack structure devices... [more] EID2020-11 SDM2020-45
pp.42-45
CPM 2020-10-29
15:30		 Online Online Characterization of Photocatalytic Gold-Doped Tantalum Pentoxide Thin Films Prepared Using a Simple Co-Sputtering Method
Kai Ito, Yuya Hashimoto, Kenta Miura, Katsuya Noguchi, Wataru Kada, Osamu Hanaizumi (Gunma Univ.) CPM2020-18		 Gold-doped tantalum pentoxide (Ta2O5:Au) thin films were deposited using a co-sputtering method. From a transmission spe... [more] CPM2020-18
pp.27-30
EID, ITE-IDY, IEIJ-SSL, SID-JC, IEE-EDD [detail] 2019-01-25
09:45		 Kagoshima Kagoshima University Electroluminescence of Thin-film Inorganic EL Devices with CeO2
Takemasa Akiyama, Kunitoshi Yanagihara, Noboru Miura (Meiji Univ.) EID2018-11		 (To be available after the conference date) [more] EID2018-11
pp.73-76
OPE 2011-12-16
13:55		 Tokyo Kikai-Shinko-Kaikan Bldg. Light-emitting properties of rare-earth-doped Ta2O5 thin films fabricated by using rf sputtering
Kenta Miura, Yuki Arai, Osamu Hanaizumi (Gunma Univ.) OPE2011-143		 Eu-doped Ta2O5 films were prepared by using rf magnetron sputtering. Visible photoluminescence was obtained from the fil... [more] OPE2011-143
pp.13-16
US 2011-09-27
10:25		 Miyagi Tohoku Univ. Evaluation of Glass Multilayer Films by the Line-Focus-Beam Ultrasonic Material Characterization System
Mototaka Arakawa, Jun-ichi Kushibiki (Tohoku Univ.), Kazuhiko Itoh, Kazuyuki Etoh (JAE) US2011-56		 Multilayer films for optical cavity with ultra-high finesse were evaluated by the line-focus-beam ultrasonic material ch... [more] US2011-56
pp.53-57
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