| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2023-02-28 16:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability Ruijun Ma (AUST), Stefan Holst, Xiaoqing Wen (KIT), Hui Xu (AUST), Aibin Yan (AU)  DC2022-91 |
The continuous pursuing of smaller technology nodes makes modern Integrated Circuits (ICs) more and more susceptible to ... [more] | DC2022-91 pp.51-55 |
| DC | 2021-02-05 11:35 |
Online | Online | A Novel High Performance Scan-Test-Aware Hardened Latch Design Ruijun Ma, Stefan Holst, Xiaoqing Wen (KIT), Aibin Yan (AHU), Hui Xu (AUST) DC2020-71 |
As modern technology nodes become more and more susceptible to soft-errors, many radiation hardened latch designs have b... [more] | DC2020-71 pp.12-17 |
| VLD, HWS (Joint) |
2018-02-28 16:55 |
Okinawa | Okinawa Seinen Kaikan | Reliability Evaluation of Mixed Error Correction Scheme for Soft-Error Tolerant Datapaths Junghoon Oh, Mineo Kaneko (JAIST) VLD2017-102 |
Among several problems with miniaturization of LSIs, soft-errors are one of serious problems to make reliability worse. ... [more] | VLD2017-102 pp.79-84 |
| VLD | 2017-03-03 13:25 |
Okinawa | Okinawa Seinen Kaikan | Effect on the Chip Area of Component Adjacency Constraint for Soft-Error Tolerant Datapaths Junghoon Oh, Mineo Kaneko (JAIST) VLD2016-129 |
Due to the downsizing of VLSI, reliability issues caused by soft-errors have become more explicit. Several studies in sy... [more] | VLD2016-129 pp.151-156 |
| VLD | 2016-02-29 15:50 |
Okinawa | Okinawa Seinen Kaikan | ILP Based Synthesis of Soft-Error Tolerant Datapaths Considering Adjacency Constraint between Components Junghoon Oh, Mineo Kaneko (JAIST) VLD2015-116 |
As the device size decreases, the reliability degradation due to soft-errors is becoming one of the serious issues in VL... [more] | VLD2015-116 pp.31-36 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-03 10:10 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | An Approach to Soft-Error Tolerant Datapath Synthesis Considering Adjacency Constraint between Components Junghoon Oh, Mineo Kaneko (JAIST) VLD2015-62 DC2015-58 |
As the device size decreases, the reliability degradation due to soft-errors is becoming one of the serious issues in VL... [more] | VLD2015-62 DC2015-58 pp.159-164 |
| RCC, MICT | 2015-05-28 15:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Rapid Recovery Technique from Soft Error of FPGAs in Information and Communication Apparatus Kenichi Shimbo, Tadanobu Toba, Takumi Uezono, Hidefumi Ibe (Hitachi) RCC2015-9 MICT2015-9 |
As the amount of data traffic through the communication infrastructure is increasing, a development of high-speed inform... [more] | RCC2015-9 MICT2015-9 pp.37-42 |
| VLD | 2015-03-03 10:20 |
Okinawa | Okinawa Seinen Kaikan | ILP Based Synthesis for Area-Efficient Soft-Error Tolerant Datapaths Junghoon Oh, Mineo Kaneko (JAIST) VLD2014-164 |
As the device size decreases, reliability degradation caused by soft-errors has become one of the greatest issues in VLS... [more] | VLD2014-164 pp.67-72 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2014-11-26 17:05 |
Oita | B-ConPlaza | Selection of Check Variables for Area-Efficient Soft-Error Tolerant Datapath Synthesis Junghoon Oh, Mineo Kaneko (JAIST) VLD2014-90 DC2014-44 |
As the device size decreases, the reliability degradation caused by soft-errors becomes one of the greatest issues in cu... [more] | VLD2014-90 DC2014-44 pp.129-134 |
| VLD | 2014-03-05 10:00 |
Okinawa | Okinawa Seinen Kaikan | Area-Efficient Soft-Error Tolerant Datapath Design Based on Aggressive Resource Sharing Junghoon Oh, Mineo Kaneko (JAIST) VLD2013-156 |
As the device size decreases, the reliability problem caused by soft-errors becomes one of the big issues in current and... [more] | VLD2013-156 pp.119-124 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-28 16:05 |
Miyazaki | NewWelCity Miyazaki | Fast soft-error recovery method for duplicated softcore processor system Yoshihiro Ichinomiya, Makoto Fujino, Motoki Amagasaki, Morihiro Kuga, Masahiro Iida, Toshinori Sueyoshi (Kumamoto Univ.) RECONF2011-42 |
This paper presents a technique for ensuring the reliability of the softcore processor which implemented with SRAM-based... [more] | RECONF2011-42 pp.7-12 |
| VLD, IPSJ-SLDM | 2010-05-19 17:00 |
Fukuoka | Kitakyushu International Conference Center | Error Propagation Probability-based Selective TMR for Reliable Coarse-Grained Reconfigurable Architecture Hiroshi Yuasa, Takashi Imagawa, Masayuki Hiromoto, Hiroyuki Ochi, Takashi Sato (Kyoto Univ.) VLD2010-4 |
Advancing CMOS process technology implies decreasing operating voltages, leaving LSI increasingly vulnerable to temporar... [more] | VLD2010-4 pp.37-42 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-02 13:50 |
Kochi | Kochi City Culture-Plaza | [Invited Talk]
Failures due to Terrestriall Neutrons in Most Advanced Semicondutor Devices
-- Impacts and Hardening Techniques down to 22nm Design Rule -- Eishi Ibe, Kenichi Shimbo, Hitoshi Taniguchi, Tadanobu Toba (Hitachi, Ltd.) CPM2009-139 ICD2009-68 |
The status-of-the-art in failures and their mechanisms of CMOS memories and logic gates induced by terrestrial neutrons ... [more] | CPM2009-139 ICD2009-68 pp.29-34 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-03 10:00 |
Kochi | Kochi City Culture-Plaza | Correlation of Mitigation of Soft-error Rate of Routers between Neutron Irradiation Test and Field Soft-error Data Kenichi Shimbo, Tadanobu Toba, Hidehumi Ibe, Koji Nishii (Hitachi) CPM2009-143 ICD2009-72 |
We evaluated the soft error tolerance of the information system by the neutron irradiation test. We estimated the correl... [more] | CPM2009-143 ICD2009-72 pp.51-55 |
| DC, CPSY | 2008-04-23 15:00 |
Tokyo | Tokyo Univ. | Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems Eishi Ibe (PERL) CPSY2008-7 DC2008-7 |
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicon... [more] |
CPSY2008-7 DC2008-7 pp.37-42 |
| ICD | 2008-04-18 11:15 |
Tokyo | [Invited Talk]
Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
-- Evolution of Multi-Node Upset Issues -- Eishi Ibe (PERL) ICD2008-10 |
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicond... [more] | ICD2008-10 pp.51-56 |
|
[Return to Top Page]