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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2012-12-18
10:55
Tokyo Tokyo Tech Front [Invited Talk] Soft-error evaluation and mitigation technologies
Taiki Uemura (Fujitsu Semiconductor Ltd.) ICD2012-116
Soft-Error is transient error in electron devices. Soft-error is triggered by cosmic-ray induced neutrons and alpha rays... [more] ICD2012-116
pp.103-108
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-28
14:55
Fukuoka Centennial Hall Kyushu University School of Medicine Neutron Induced Single Event Multiple Transients With Voltage Scaling and Body Biasing
Ryo Harada (Osaka Univ.), Yukio Mitsuyama (Kochi Univ. of Tech.), Masanori Hashimoto, Takao Onoye (Osaka Univ.) VLD2012-100 DC2012-66
This paper presents measurement results of neutron induced single event multiple transients (SEMT). We devise an SEMT me... [more] VLD2012-100 DC2012-66
pp.237-241
SDM 2010-11-12
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. Modeling of Single-Event-Transient Pulse Generation in Inverter Cells
Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) SDM2010-180
Soft errors in logic circuits due to the propagation of erroneous signal caused by ionized particle generated by cosmic ... [more] SDM2010-180
pp.47-52
VLD 2010-09-28
15:25
Kyoto Kyoto Institute of Technology Measurement Circuits for Acquiring SET PulseWidth Distribution with Fine Time Resolution
Ryo Harada, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye (Osaka Univ.) VLD2010-55
This paper presents two circuits to measure pulse width distribution of
single event transients (SETs). We first revie... [more]
VLD2010-55
pp.77-82
SANE 2008-06-26
16:30
Ibaraki Tsukuba Space Center (JAXA) Radiation-Induced Transient-Pulses in Logic LSIs for Use in Space Applications
Takahiro Makino (SOKENDAI), Yoshimitsu Yanagawa (U. Tokyo), Daisuke Kobayashi (SOKENDAI/JAXA), Seisuke Fukuda (JAXA), Kazuyuki Hirose, Hirokazu Ikeda (SOKENDAI/JAXA), Hirobumi Saito (U. Tokyo/JAXA), Shinobu Onoda, Toshio Hirao, Takeshi Ohshima (JAEA), Daisuke Takahashi, Shigeru Ishii, Masaki Kusano, Hiroshi Ikebuchi, Yoshikatsu Kuroda (MHI) SANE2008-25
SET pulse-widths were measured as a function of LET by using pulse capture circuits.
In addition, a scan flip-flop (FF... [more]
SANE2008-25
pp.67-72
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