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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2012-12-18 10:55 |
Tokyo |
Tokyo Tech Front |
[Invited Talk]
Soft-error evaluation and mitigation technologies Taiki Uemura (Fujitsu Semiconductor Ltd.) ICD2012-116 |
Soft-Error is transient error in electron devices. Soft-error is triggered by cosmic-ray induced neutrons and alpha rays... [more] |
ICD2012-116 pp.103-108 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 14:55 |
Fukuoka |
Centennial Hall Kyushu University School of Medicine |
Neutron Induced Single Event Multiple Transients With Voltage Scaling and Body Biasing Ryo Harada (Osaka Univ.), Yukio Mitsuyama (Kochi Univ. of Tech.), Masanori Hashimoto, Takao Onoye (Osaka Univ.) VLD2012-100 DC2012-66 |
This paper presents measurement results of neutron induced single event multiple transients (SEMT). We devise an SEMT me... [more] |
VLD2012-100 DC2012-66 pp.237-241 |
SDM |
2010-11-12 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Modeling of Single-Event-Transient Pulse Generation in Inverter Cells Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) SDM2010-180 |
Soft errors in logic circuits due to the propagation of erroneous signal caused by ionized particle generated by cosmic ... [more] |
SDM2010-180 pp.47-52 |
VLD |
2010-09-28 15:25 |
Kyoto |
Kyoto Institute of Technology |
Measurement Circuits for Acquiring SET PulseWidth Distribution with Fine Time Resolution Ryo Harada, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye (Osaka Univ.) VLD2010-55 |
This paper presents two circuits to measure pulse width distribution of
single event transients (SETs). We first revie... [more] |
VLD2010-55 pp.77-82 |
SANE |
2008-06-26 16:30 |
Ibaraki |
Tsukuba Space Center (JAXA) |
Radiation-Induced Transient-Pulses in Logic LSIs for Use in Space Applications Takahiro Makino (SOKENDAI), Yoshimitsu Yanagawa (U. Tokyo), Daisuke Kobayashi (SOKENDAI/JAXA), Seisuke Fukuda (JAXA), Kazuyuki Hirose, Hirokazu Ikeda (SOKENDAI/JAXA), Hirobumi Saito (U. Tokyo/JAXA), Shinobu Onoda, Toshio Hirao, Takeshi Ohshima (JAEA), Daisuke Takahashi, Shigeru Ishii, Masaki Kusano, Hiroshi Ikebuchi, Yoshikatsu Kuroda (MHI) SANE2008-25 |
SET pulse-widths were measured as a function of LET by using pulse capture circuits.
In addition, a scan flip-flop (FF... [more] |
SANE2008-25 pp.67-72 |
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