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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| LQE, ED, CPM | 2023-12-01 14:25 |
Shizuoka | Fabrication of GaN-based VCSELs with cavity length control including ITO electrode and Nb2O5 spacer Ruka Watanabe, Kenta Kobayashi, Mitsuki Yanagawa, Tetsuya Takeuchi, Satoshi Kamiyama, Motoaki Iwaya (Meijo Univ.)  ED2023-32 CPM2023-74 LQE2023-72 |
In the fabrication of vertical-cavity surface-emitting lasers (VCSELs), high controllability of the resonance wavelength... [more] | ED2023-32 CPM2023-74 LQE2023-72 pp.80-83 |
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| OME | 2023-11-01 15:10 |
Hyogo | JIBASAN Bidg. (Himeji) | [Invited Talk]
Thermal and non-thermal equilibrium process of charge carrier extraction in metal/insulator/organic Semiconductor/metal (MIOM) Junction Hiroyuki Tajima, Takeshi Oda (Univ. Hyogo), Tomofumi Kadoya (Konan Univ.) OME2023-47 |
This paper presents the concept and experimental evidence of the non-thermal equilibrium (NTE) process of charge-carrier... [more] | OME2023-47 pp.21-26 |
| CPM, ED, SDM | 2023-05-19 13:00 |
Aichi | Nagoya Institute of Technology (Primary: On-site, Secondary: Online) |
[Invited Talk]
Repeated bending endurance test of zinc oxide thin films deposited at room temperature on flexible substrates Toshihiko Maemoto, Kazuyori Oura, Hideo Wada, Masatoshi Koyama, Shigehiko Sasa, Ahikiko Fujii (Osaka Inst. of Tech.) ED2023-1 CPM2023-1 SDM2023-18 |
We investigated the device structure of oxide thin-film devices that can operate even when bending, the evaluation of th... [more] | ED2023-1 CPM2023-1 SDM2023-18 pp.1-6 |
| CPM, ED, SDM | 2023-05-19 16:30 |
Aichi | Nagoya Institute of Technology (Primary: On-site, Secondary: Online) |
Low-damage photo-electrochemical etching and electrochemical characterization of p-GaN layers grown on n-GaN substrates Umi Takatsu, Kouta Kubo, Taketomo Sato (Hokkaido Univ.) ED2023-7 CPM2023-7 SDM2023-24 |
The effect of photoelectrochemical (PEC) etching on intentionally damaged p-GaN surfaces was investigated. The electroch... [more] | ED2023-7 CPM2023-7 SDM2023-24 pp.28-31 |
| OME, SDM | 2022-04-23 10:45 |
Miyazaki | Takachiho Hall (Primary: On-site, Secondary: Online) |
Direct Observation and Evaluation of In-gap States of Inorganic and Organic Semiconductors via High-sensitivity UV Photoelectron Spectroscopy Ryotaro Nakazawa, Kenta Watanabe, Yuya Tanaka, Hisao Ishii (Chiba Univ.) SDM2022-11 OME2022-11 |
The properties of devices based on inorganic and organic semiconductors are often greatly affected by in-gap states that... [more] | SDM2022-11 OME2022-11 pp.51-56 |
| ED, CPM, LQE | 2021-11-26 16:25 |
Online | Online | Fabrication of Recessed-gate AlGaInN/AlGaN HFETs utilizing a photo-electrochemical (PEC) etching. Kosaku Ito, Yuto Komatsu, Masachika Toguchi (Hokkaido Univ.), Akiyoshi Inoue, Sakura Tanaka, Makoto Miyoshi (Nagoya Inst. of Tech), Taketomo Sato (Hokkaido Univ.) ED2021-35 CPM2021-69 LQE2021-47 |
We utilized photo-electrochemical (PEC) etching for fabrication of recessed-gate AlGaInN/AlGaN MIS HFETs. The PEC reacti... [more] | ED2021-35 CPM2021-69 LQE2021-47 pp.91-94 |
| EID, SDM, ITE-IDY [detail] | 2020-12-02 11:25 |
Online | Online | Stacked cross-point memory of synaptic elements using IGZO thin film Etsuko Iwagi (RU), Takumi Tsuno (NAIST), Mutsumi Kimura (RU) EID2020-4 SDM2020-38 |
We conducted research and development of a large hardware neural network by using oxide semiconductors of In-Ga-Zn-O (IG... [more] | EID2020-4 SDM2020-38 pp.13-16 |
| ICD, HWS [detail] | 2020-10-26 14:55 |
Online | Online | Physical-Level Detection Approach against Hardware Trojans inside Semiconductor Chips (II) Hirofumi Sakane, Shinichi Kawamura, Kentaro Imafuku, Yohei Hori, Makoto Nagata, Yuichi Hayashi, Tsutomu Matsumoto (AIST) HWS2020-35 ICD2020-24 |
Hardware Trojans, known to be designed and crafted with malicious intent and deployed to be part of the hardware of the ... [more] | HWS2020-35 ICD2020-24 pp.59-64 |
| EMCJ, EMD, WPT, PEM (Joint) [detail] |
2019-07-19 11:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Lecture]
Development of High Frequency Electric Field Sensor with Optically Modulated Scattering Technique and its Application to EMC Noise Scanner Takahiro Kurosawa (AITC), Takashi Komakine (Akita NCT) |
Electric field measurement sensor based on the modulated scattering technique with optically modulated scatterer had dev... [more] | |
| ED, THz | 2018-12-18 12:00 |
Miyagi | RIEC, Tohoku Univ. | Low temperature liquid phase growth and terahertz optical properties of 2D layered semiconductor InSe crystal Chao Tang, Yohei Sato, Katsuya Watanabe, Junya Osaki, Tadao Tanabe, Yutaka Oyama (Tohoku Univ.) ED2018-68 |
High quality InSe crystals have been successfully grown by temperature difference method under controlled vapor pressure... [more] | ED2018-68 pp.57-59 |
| OME | 2018-11-28 13:00 |
Hyogo | JIBASAN Bidg. | [Invited Talk]
Measurement of Charge Injection Barrier at Organic Semiconductor/Metal Interface using Accumulated Charge Measurement (ACM) Hiroyuki Tajima, Tomofumi Kadoya (Univ. Hyogo) OME2018-26 |
e recently reported a new technique named accumulated charge measurement (ACM) for directly determining the charge injec... [more] | OME2018-26 pp.1-4 |
| EID, ITE-IDY, IEIJ-SSL, SID-JC, IEE-EDD [detail] | 2018-01-25 14:30 |
Shizuoka | Shizuoka Univ., Hamamatsu | Fabrication of Organic Semiconductor Thin Film on Molecular Orientation Insulating Film and Its Effect on TFT Characteristics Shigeru Okimoto, Yasufumi Iimura (Tokyo Univ. of A&T), Ryuzou Ohno (JSR) EID2017-36 |
We have focused on the control of molecular alignment of pentacene thin film for improving carrier mobility of pentacene... [more] | EID2017-36 pp.25-28 |
| SDM, EID | 2017-12-22 13:30 |
Kyoto | Kyoto University | Seebeck effect measurement of rare metal free oxide semiconductor Ryuki Nomura, Tatsuya Aramaki, Tokiyoshi Matsuda (Ryukoku Univ.), Kenta Umeda, Mutsunori Uenuma (NAIST), Mutsumi Kimura (Ryukoku Univ.) EID2017-17 SDM2017-78 |
It is thought that if we convert thermal energy to electric energy efficiently, we can reduce the amount of oil used. Ho... [more] | EID2017-17 SDM2017-78 pp.29-34 |
| OME | 2017-11-17 13:45 |
Osaka | Osaka Univ. Nakanoshima Center | Hole mobility measurement in organic semiconductor thin films by MIS-CELIV method Chiho Katagiri (Yamagata Univ./Osaka Univ.), Ken-ichi Nakayama (Osaka Univ./Yamagata Univ.) OME2017-28 |
The MIS-CELIV method is expected as a novel technique for measuring electron and hole mobilities in thin organic films. ... [more] | OME2017-28 pp.7-10 |
| SDM | 2017-06-20 16:50 |
Tokyo | Campus Innovation Center Tokyo | Formation of Ultrathin Crystalline Structure of Group-IV Elements on Epitaxial Ag(111) Surface Koichi Ito, Akio Ohta, Masashi Kurosawa, Masaaki Araidai, Mitsuhisa Ikeda, Katsunori Makihara, Seiichi Miyazaki (Nagoya Univ.) SDM2017-30 |
Two dimensional (2D) honeycomb crystals such as silicene and germanene are currently receiving much attention because of... [more] | SDM2017-30 pp.43-48 |
| CPM, LQE, ED | 2016-12-13 13:00 |
Kyoto | Kyoto University | Growth and application of corundum-structured n- and p-type wide band gap oxide semiconductors Kentaro Kaneko (Kyoto Univ.), Toshimi Hitora (FLOSFIA INC.), Shizuo Fujita (Kyoto Univ.) ED2016-74 CPM2016-107 LQE2016-90 |
Electronic carrier concentrations in corundum-structured α-In2O3 thin films decreased by being doped with a Mg ion. A M... [more] | ED2016-74 CPM2016-107 LQE2016-90 pp.85-88 |
| EMCJ | 2016-11-25 15:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Correlation inspection between IC level EMI test and ECU level EMI test Mikiya Iida, Yukihisa Hasegawa, Kazuhisa Matsuge (Toshiba) EMCJ2016-97 |
We made relationship between IC level EMI test standard (ICE61967) and ECU level EMI test standard (CISPR25) clear. Spec... [more] | EMCJ2016-97 pp.55-60 |
| CPM | 2016-11-18 13:50 |
Ishikawa | Preparation of SnS films by chemical solution deposition using microwave irradiation Ryo Hayakawa, Yasushi Takano, Akihiro Ishida (Shizuoka Univ.) CPM2016-62 |
SnS thin films were deposited on glass slides in a chemical solution. The solution was prepared by mixing stannous dichl... [more] | CPM2016-62 pp.5-10 |
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| CPM | 2016-11-19 11:15 |
Ishikawa | Microwave activated chemical bath deposition of ZnO thin films Hiroaki Yoshiyachi, Yasushi Takano (Shizuoka Univ.) CPM2016-72 |
Zinc oxide (ZnO) film has been deposited using chemical bath deposition (CBD).We compared ZnO fims deposited by microwav... [more] | CPM2016-72 pp.55-58 |
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| PRMU | 2016-10-21 11:10 |
Miyazaki | Photometric Stereo by SEM Image Utilizing Region Division Hiroki Matsuse, Gou Koutaki, Keiichi Uchimura (Kumamoto Univ.), Atsushi Miyamoto (Hitachi) PRMU2016-100 |
In this paper, we present a three-dimensional (3D) reconstruction method for semiconductor pattern using a scanning elec... [more] | PRMU2016-100 pp.55-60 |
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