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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| LQE, ED, CPM | 2023-11-30 14:55 |
Shizuoka | Two-dimensional characterization of Au/Ni/thin heavily-Mg-doped p-GaN/n-GaN Schottky contacts under applied voltage by scanning internal photoemission microscopy Haruto Yoshimura, Hiroki Imabayashi (Fukui univ.), Fumimasa Horikiri, Yoshinobu Narita, Hajime Fujikura (Sumitomo Chem.), Hiroshi Ohta, Tomoyoshi Mishima (Hosei Univ.), Kenji Shiojima (Fukui univ.)  ED2023-18 CPM2023-60 LQE2023-58 |
We applied scanning internal photoemission microscopy (SIPM) method to clarify the two-dimensional basic characteristics... [more] | ED2023-18 CPM2023-60 LQE2023-58 pp.21-24 |
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| CPM | 2023-08-01 10:40 |
Hokkaido | (Primary: On-site, Secondary: Online) |
Review of Characterization of Metal/GaN Schottky Contacts Kenji Shiojima (Univ. of Fukui) CPM2023-21 |
This paper reviews innovation of metal/GaN contacts from the aspects of crystal quality, process technique, and basic un... [more] | CPM2023-21 pp.36-39 |
| HWS, VLD | 2023-03-04 11:05 |
Okinawa | (Primary: On-site, Secondary: Online) |
Clone Resistance of Artifact Metrics: Scanning Probe Lithography Based Clones Naoki Yoshida, Akira Iwahashi (YNU), Hoga Morihisa, Junko Ohta, Kaoru Sumiya (AIST), Tsutomu Matsumoto (YNU) VLD2022-117 HWS2022-88 |
The nano-artifact metrics bases its security on the fact that nanometer-order three-dimensional structures (nanopatterns... [more] | VLD2022-117 HWS2022-88 pp.245-250 |
| US | 2022-06-30 10:55 |
Osaka | Kansai University (Senriyama Campus) | Verification to improve the accuracy of acoustic impedance evaluation at very high frequencies Akira Hashimoto, Kenji Yoshida, Shinnosuke Hirata (Chiba Univ.), Hitoshi MAruyama (Juntendo Univ.), Tadashi Yamaguchi (Chiba Univ.) US2022-10 |
When using ultrahigh-frequency ultrasound with a center frequency of 250 to 300 MHz to evaluate the acoustic impedance o... [more] | US2022-10 pp.5-9 |
| ED, CPM, LQE | 2021-11-26 13:00 |
Online | Online | Two-dimensional characterization of Au/Ni/n-GaN Schottky contacts with different surface treatments by scanning internal photoemission microscopy Kenji Shiojima (Univ. of Fukui), Ryo Tanaka, Shinya Takashima, Katsunori Ueno, Edo Masaharu (Fuji electric co.) ED2021-28 CPM2021-62 LQE2021-40 |
We report the basic electrical characteristics and uniformity of 25 Au/Ni Schottky barrier diodes (SBDs) with three diff... [more] | ED2021-28 CPM2021-62 LQE2021-40 pp.63-66 |
| ED, CPM, LQE | 2021-11-26 13:25 |
Online | Online | Uniformity characterization of SiC, GaN, α-Ga₂O₃ Schottky contacts using scanning internal photoemission microscopy Yuto Kawasumi (Univ. of Fukui), Fumimasa Horikiri, Noboru Fukuhara (SCIOCS Co.), Tomoyoshi Mishima (Hosei Univ.), Takashi Shinohe (FLOSFIA INC.), Kenji Shiojima (Univ. of Fukui) ED2021-29 CPM2021-63 LQE2021-41 |
Uniformity characterization of Ni/SiC, Ni/GaN, and Cu/Ti/$alpha$-Ga2O3 Schottky contacts was performed by scanning inter... [more] | ED2021-29 CPM2021-63 LQE2021-41 pp.67-70 |
| LQE, CPM, ED | 2020-11-26 14:40 |
Online | Online | Two-Dimensional Characterization of n-GaN Schottky Contacts Printed by Using Ni Nanoink Yuto Kawasumi, Yuto Yasui (Univ. of Fukui), Yukiyasu Kashiwagi, Toshiyuki Tamai (ORIST), Kenji Shiojima (Univ. of Fukui) ED2020-10 CPM2020-31 LQE2020-61 |
Two-dimensional characterization of n-GaN Schottky contacts formed by printing method using Ni nanoink was performed by ... [more] | ED2020-10 CPM2020-31 LQE2020-61 pp.37-40 |
| OME | 2020-01-24 14:00 |
Ishikawa | Shiinoki-Geihinkan (Kanazawa) | Visible light photocatalyst based on organic photovoltaic cell Keiji Nagai (Tokyo Tech), Takayuki Kuwabara (Kanazawa Univ.), Mohd Fairus Ahmad (UniMAP), Masahiro Nakano, Makoto Karakawa, Tetsuya Taima, Kohshin Takahashi (Kanazawa Univ.), Toshiyuki Abe (Hirosaki Univ.) OME2019-60 |
Photocatalytic and photoelectrochemical redox was observed in active layers of photovoltaic cell such as PCBM:P3HT/ZnO,... [more] | OME2019-60 pp.5-8 |
| CPM | 2019-11-08 10:50 |
Fukui | Fukui univ. | [Invited Talk]
Mapping of metal/semiconductor and semiconductor/semiconductor interfaces using scanning internal photoemission microscopy Kenji Shiojima (Univ. of Fukui) CPM2019-51 |
Scanning internal photoemission spectroscopy has been developed to map the electrical characteristics of metal/semicondu... [more] | CPM2019-51 pp.35-38 |
| ED, LQE, CPM | 2018-11-29 14:40 |
Aichi | Nagoya Inst. tech. | Scanning internal photoemission microscopy measurements of n-GaN Schottky contacts under applying voltage Kenji Shiojima, Masataka Maeda (Univ. of Fukui), Tomoyoshi Mishima (Hosei Univ.) ED2018-36 CPM2018-70 LQE2018-90 |
We applied scanning internal photoemission microscopy (SIPM) method to characterize the initial stage of the degradation... [more] | ED2018-36 CPM2018-70 LQE2018-90 pp.17-20 |
| ED, CPM, SDM | 2018-05-24 14:45 |
Aichi | Toyohashi Univ. of Tech. (VBL) | Growth of high quality InSb channel layer with InxGa1-xSb heteroepitaxial films on Si(111) A. A. Mohammad Monzur-Ul-Akhir, Masayuki Mori, Koichi Maezawa (University of Toyama) ED2018-17 CPM2018-4 SDM2018-12 |
InSb has met the requirements of high-performance channel material with faster response towards ultra-fast and very low ... [more] | ED2018-17 CPM2018-4 SDM2018-12 pp.15-18 |
| MRIS, ITE-MMS | 2017-12-07 15:20 |
Ehime | Ehime Univ. | Demonstration of High Speed Reading in Ferroelectric Data Storage Using Pb(Zr,Ti)O3 Recording Medium Reshan Maduka Abeysinghe, Yoshiomi Hiranaga, Yasuo Cho (RIEC, Tohoku Univ.) MR2017-31 |
High-speed readout tests were conducted using a hard disk drive (HDD) type ferroelectric data storage test system based ... [more] | MR2017-31 pp.29-34 |
| LQE, CPM, ED | 2017-11-30 16:15 |
Aichi | Nagoya Inst. tech. | Mapping of wavy surface morphology of n-GaN using scanning internal photoemission microscopy Kenji Shiojima, Takanori Hashizume (Univ. of Fukui), Masafumi Horikiri, Takeshi Tanaka (SCIOCS), Tomoyoshi Mishima (Hosei Univ.) ED2017-55 CPM2017-98 LQE2017-68 |
We characterized the effect of the surface morphology on electrical properties of the n-GaN drift-layers by using scanni... [more] | ED2017-55 CPM2017-98 LQE2017-68 pp.27-32 |
| MBE, NC (Joint) |
2017-03-14 13:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Microcirculatory velocity estimation with radon transformation for confocal laser scanning microscopic image Kazuhiro Nakamura, Mutoh Tatsushi, Kazumasu Sasaki (Akita Noken/Tohoku Univ.), Yasuyuki Taki (Tohoku Univ.), Tatsuya Ishikawa (Akita Noken) MBE2016-96 |
Radon transformation for line-scan image of the confocal laser-scanning microscopy are a means to observe the velocity o... [more] | MBE2016-96 pp.71-74 |
| CPM, LQE, ED | 2016-12-12 13:25 |
Kyoto | Kyoto University | Observation of Initial Stage of Degradation in Au/Ni/n-GaN Schottky Diodes Using Scanning Internal Photoemission Microscopy Kenji Shiojima, Shingo Murase, Masataka Maeda (Univ. of Fukui), Tomoyoshi Mishima (Hosei Univ.) ED2016-58 CPM2016-91 LQE2016-74 |
We characterized an early stage of interface degradation by high-reverse-voltage application in Au/Ni/n-GaN Schottky con... [more] | ED2016-58 CPM2016-91 LQE2016-74 pp.5-8 |
| PRMU, IE, MI, SIP | 2016-05-20 16:10 |
Aichi | Analysis of 3D Periodic Network Structures of Liver Bile Canaliculus in CLSM Images Shogo Sakuma, Hidekata Hontani (NITech), Hiroto Shoji (KPUM) SIP2016-30 IE2016-30 PRMU2016-30 MI2016-30 |
The objective of this research is to develop a method for analyzing 3D graph structures of bile canaliculus networks in... [more] |
SIP2016-30 IE2016-30 PRMU2016-30 MI2016-30 pp.157-160 |
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| MRIS, ITE-MMS, IEE-MAG | 2016-03-04 13:10 |
Aichi | Nagoya Univ. | Nanoscale domain inversion in ferroelectric Y:HfO2 thin film Zhou Chen, Yoshiomi Hiranaga (Tohoku Univ.), Takao Shimizu, Kiriha Katayama, Takanori Mimura, Hiroshi Funakubo (Tokyo Tech), Yasuo Cho (Tohoku Univ.) MR2015-34 |
In recent years, ferroelectricity in hafnium oxide thin film such as Y:HfO2 thin film has been demonstrated. But until n... [more] | MR2015-34 pp.29-32 |
| MRIS, ITE-MMS | 2015-10-23 11:10 |
Osaka | Osaka Univ. | [Invited Talk]
Analysis of magnetic devices by spin-polarized scanning electron microscopy
-- Microscopic Magnetization Measurements using Spin Polarization of Electrons -- Teruo Kohashi (Hitachi) MR2015-21 |
Spin-Polarized Scanning Electron Microscopy (Spin SEM) is one way for observing magnetic domain structures taking advant... [more] | MR2015-21 pp.37-41 |
| MRIS, ITE-MMS | 2014-12-11 15:30 |
Ehime | Ehime Univ. | Achievement of Much Higher Memory Density and Realization of Successive Writing and Reading Operation in HDD-Type Ferroelectric Data Storage System Tomonori Aoki, Yoshiomi Hiranaga, Yasuo Cho (Tohoku Univ.) MR2014-33 |
Ferroelectric data storage system records the data bits in the form of the polarization direction. In this system, data ... [more] | MR2014-33 pp.29-33 |
| LQE, ED, CPM | 2014-11-28 13:40 |
Osaka | Mapping of thermal degradation of Au/Ni/n-GaN Schottky diodes using scanning internal photoemission microscopy Kenji Shiojima, Shingo Yamamoto, Yuhei Kihara (Univ. of Fukui) ED2014-91 CPM2014-148 LQE2014-119 |
We have developed a new mapping technique, scanning internal–photoemission microscopy, to characterize the electri... [more] | ED2014-91 CPM2014-148 LQE2014-119 pp.85-90 |
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