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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2018-02-20 10:35 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Reduction of Wire Length by Reordering Delay Elements in Boundary Scan Circuit with Embedded TDC Satoshi Hirai, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) DC2017-79 |
TSV attracts attention as a new implementation method of interconnects between dies in 3DICs.
However, faulty TSVs may ... [more] |
DC2017-79 pp.13-18 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-01 12:45 |
Nagasaki |
Nagasaki Kinro Fukushi Kaikan |
Scan Segmentation Approach to Magnify Detection Sensitivity for Tiny Hardware Trojan Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST) VLD2015-38 DC2015-34 |
Outsourcing of IC fabrication components has initiated the potential threat of design tempering using hardware Trojans ... [more] |
VLD2015-38 DC2015-34 pp.1-6 |
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