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Committee Date Time Place Paper Title / Authors Abstract Paper #
RECONF 2015-06-20
14:00		 Kyoto Kyoto University On the Evaluation Board AISTino equipped with the Fourth Flex Power FPGA chip with SOTB transistors
Hanpei Koike, Masakazu Hioki, Yasuhiro Ogasahara (AIST), Hayato Ishigaki, Toshiyuki Tsutsumi (Meiji Univ.), Tadashi Nakagawa, Toshihiro Sekigawa (AIST) RECONF2015-22		 Flex Power FPGA utilizes threshold voltage programmability to reduce its static power by the body bias control of circui... [more] RECONF2015-22
pp.119-124
CPSY, IPSJ-EMB, IPSJ-SLDM, DC [detail] 2015-03-07
08:30		 Kagoshima   Power optimization of low-power reconfigurable accelerator CMA-SOTB
Yu Fujita, Hayate Okuhara, Koichiro Masuyama, Hideharu Amano (Keio Univ.) CPSY2014-174 DC2014-100		 (To be available after the conference date) [more] CPSY2014-174 DC2014-100
pp.71-76
ICD, CPSY 2014-12-02
14:50		 Tokyo Kikai-Shinko-Kaikan Bldg. Measurements and Evaluations of Aging Degradation Caused by Plasma Induced Damage in 65 nm Process
Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. Tech.) ICD2014-106 CPSY2014-118		 Degradations of reliability caused by plasma induced damage (PID) have become a significant concern with miniaturizing a... [more] ICD2014-106 CPSY2014-118
pp.123-128
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2013-11-28
13:20		 Kagoshima   Evaluations of Variations on Ring Oscillators from Plasma Induced Damage in Bulk and SOTB Processes
Ryo Kishida, Michitarou Yabuuchi, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2013-83 DC2013-49		 A degradation of reliability caused by plasma induced damage has become a significant concern with miniaturizing a devic... [more] VLD2013-83 DC2013-49
pp.159-164
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2013-11-28
13:45		 Kagoshima   Evaluation of The First Flex Power FPGA chip with SOTB transistors
Chao Ma (AIST/Meiji Univ.), Masakazu Hioki (AIST), Takashi Kawanami (KIT), Yasuhiro Ogasahara, Tadashi Nakagawa, Toshihiro Sekigawa (AIST), Toshiyuki Tsutsumi (AIST/Meiji Univ.), Hanpei Koike (AIST) RECONF2013-53		 Flex Power FPGA was able to utilize a programmable threshold voltage to each circuit block of the FPGA by using the body... [more] RECONF2013-53
pp.77-82
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