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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD, ITE-IST [detail] 2019-08-07
16:30		 Hokkaido Hokkaido Univ., Graduate School /Faculty of Information Science and [Invited Talk] High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications
Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics) SDM2019-39 ICD2019-4		 Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is d... [more] SDM2019-39 ICD2019-4
pp.15-19
SDM 2017-10-26
13:00		 Miyagi Niche, Tohoku Univ. [Invited Lecture] High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SG-MONOS flash memory for security applications
Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics) SDM2017-58		 Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is d... [more] SDM2017-58
pp.45-49
ICD 2017-04-20
15:20		 Tokyo   [Invited Talk] Embedded Flash Technology for Automotive Applications
Masaya Nakano, Takashi Ito, Tadaaki Yamauchi, Yasuo Yamaguchi, Takashi Kono, Hideto Hidaka (Renesas Electronics) ICD2017-8		 Higher fuel-efficient engine and advanced driver assistance system (ADAS) require the further progress of embedded Flash... [more] ICD2017-8
pp.39-44
ICD 2015-04-16
14:25		 Nagano   [Invited Talk] A 28nm Embedded SG-MONOS Flash Macro for Automotive Achieving 200MHz Read Operation and 2.0MB/s Write Throughput at Tj of 170℃
Makoto Muneyasu, Yasuhiko Taito, Masaya Nakano, Takashi Ito, Takashi Kono, Kenji Noguchi, Hideto Hidaka, Tadaaki Yamauchi (Renesas) ICD2015-4		 First-ever 28nm embedded SG-MONOS flash macros are presented to realize aggressive device scaling with improved reliabil... [more] ICD2015-4
pp.15-19
ICD 2013-04-12
09:20		 Ibaraki Advanced Industrial Science and Technology (AIST) [Invited Talk] High Performance and High Reliability 40nm Embedded SG-MONOS Flash Macros for Automotive -- 160MHz Random Access for Code and Endurance Over 10M Cycles for Data --
Tomoya Ogawa, Takashi Kono, Takashi Ito, Tamaki Tsuruda, Takayuki Nishiyama, Tsutomu Nagasawa, Yoshiyuki Kawashima, Hideto Hidaka, Tadaaki Yamauchi (Renesas Electronics) ICD2013-13		 The markets of Flash MCUs, microcontrollers with embedded flash memory (eFlash), have been steadily growing since the mi... [more] ICD2013-13
pp.61-66
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