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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 12 of 12  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2023-11-09
14:00
Tokyo
(Primary: On-site, Secondary: Online)
[Invited Talk] Quantum Transport Simulation for Analysis of Surface Roughness Scattering in Semiconductor Nanosheet
Jo Okada, Hajime Tanaka, Nobuya Mori (Osaka Univ.) SDM2023-65
A numerical method is proposed to calculate the transport mean free path of single-mode semiconductor nanosheets with su... [more] SDM2023-65
pp.10-15
SDM 2023-06-26
10:10
Hiroshima Hiroshima Univ. (Res. Inst. of Nanodevices) [Memorial Lecture] Optimum Design of Channel Material and Surface Orientation for Extremely Thin Body nMOSFETs Based on Nonlinear Modeling of Surface Roughness Scattering
Kei Sumita, Min-Soo Kang, Chia-Tsong Chen, Kasidit Toprasertpong, Mitsuru Takenaka, Shinichi Takagi (U. Tokyo) SDM2023-27
Nano-sheet channel has been recently adopted in logic CMOS as the next-generation channel for FinFET because the nano-sh... [more] SDM2023-27
pp.1-4
SDM 2022-11-10
11:00
Online Online [Invited Talk] Optimum Design of Channel Material and Surface Orientation for Extremely-Thin-Body nMOSFETs under Nonlinear Modeling of Surface Roughness Scattering
Kei Sumita, Min-Soo Kang, Chia-Tsong Chen, Kasidit Toprasertpong, Mitsuru Takenaka, Shinichi Takagi (Univ. Tokyo) SDM2022-65
Extremely-thin-body (ETB) channels are regarded as the most promising channel structure for future CMOS technology nodes... [more] SDM2022-65
pp.7-12
SDM 2022-01-31
15:00
Online Online [Invited Talk] ****
Kei Sumita, Chia-Tsong Chen, Kasidit Toprasertpong, Mitsuru Takenaka, Shinich Takagi (Univ.of Tokyo) SDM2021-71
Mobility reduction due to surface roughness scattering is a critical concern for Extremely-Thin-Body (ETB) nanosheet cha... [more] SDM2021-71
pp.12-15
PN, MWP, EMT, PEM, IEE-EMT [detail] 2022-01-27
10:35
Online Online Modeling and experimental study of W-band millimeter-wave scattering from slightly rough surfaces
Riku Yoshino, Tomohiko Kanaya, Shintaro Takada, Kunihisa Jitsuno (Waseda Univ), Keizo Inagaki (NICT), Tetsuya Kawanishi (Waseda Univ) PN2021-33 EMT2021-49 MWP2021-38
Recently, millimeter-wave and THz bands have been attracting attention as transmission media for high-speed wireless com... [more] PN2021-33 EMT2021-49 MWP2021-38
pp.7-10
SANE 2021-11-11
14:30
Online Online Theoretical and Experimental Analysis of Terahertz Scattering from Rough Surfaces
Suyun Wang, Takayoshi Yamada (NICT), Kun-Shan Chen (Guilin University of Technology), Yasuko Kasai (NICT) SANE2021-38
In this paper, we explore the terahertz scattering from statistically-specified randomly rough surfaces at 480 GHz. Thes... [more] SANE2021-38
pp.36-39
SANE 2019-11-01
14:00
Overseas KOREA (Jeju) Depolarization of Scattering From a Spatially Anisotropic Rough Surface With Inhomogeneous Dielectric Profile
Ying Yang (GLUT), Kun-Shan Chen, Guofei Shang, Zhao-Liang Li (Hebei GEO Univ.) SANE2019-69
Abstract Depolarized response is an inherent feature of electromagnetic (EM) waves providing the physical interpretation... [more] SANE2019-69
pp.107-111
SANE 2018-11-08
13:50
Overseas China (Xuchang) L-band bistatic radar returns from bare soils: a simulation study for soil moisture retrieval using global sensitivity analysis method
Jiangyuan Zeng, Kun-Shan Chen (RADI/CAS) SANE2018-57
In this paper, an attempt is made to identify the optimal bistatic configurations for the retrieval of bare soil moistur... [more] SANE2018-57
pp.11-16
AP 2018-03-09
14:50
Gunma Hotel Ichii (Kusatsu, Gunma) Numerical simulation of scattering from random rough surface by using physical optics
Tokio Miyake, Jun-ichi Takada (Tokyo Inst. of Tech.) AP2017-204
Since high frequency band is used in next generation mobile communication, radio wave propagation is greatly affected by... [more] AP2017-204
pp.69-73
ED, SDM 2007-06-25
13:00
Overseas Commodore Hotel Gyeongju Chosun, Gyeongju, Korea Investigation of mobility degradation in ultra-thin silicon-on-insulator by Hall effect measurements
Hironori Yoshioka, Tsunenobu Kimoto (Kyoto Univ.)
MOSFETs using ultra-thin Silicon-On-Insulator (SOI) are a promising candidate of next generation LSIs. It has been repor... [more]
SDM 2006-06-22
09:25
Hiroshima Faculty Club, Hiroshima Univ. Gate Oxide Process Dependence of CMOS Performance on Si(110) Surface
Susumu Hiyama, Junli Wang, Takayoshi Kato, Tomoyuki Hirano, Kaori Tai, Hayato Iwamoto (Sony)
We investigated gate oxide process dependence of hole mobility on Si(110) surface. We used RTO and radical oxidization a... [more] SDM2006-53
pp.65-69
LQE 2006-06-02
09:35
Fukui University of Fukui Hybrid System for Measuring Surface Undulation by Means of Reflection Method and Image Method
Tomotaka Kouzuki, Qin Shu (Univ. of Fukui), Yasunori Touma (Hokkei), Hiroshi Suga (Hiroshima International Univ.), Kazuhiko Ishikawa (Fukui Nat. Col. of Tech.), Tetsuma Sakurai (Univ. of Fukui), Masahiro Ueda (University of Fukui)
A hybrid system for measuring both surface undulation and surface roughness has been proposed by means of laser reflecti... [more] LQE2006-1
pp.1-6
 Results 1 - 12 of 12  /   
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